Abstract
Amorphous silicon carbonitride (SiCN) ceramics were synthesized by pyrolyzing a polysilazane at different temperatures between 900° and 1400°C. The microstructures and compositions of the materials obtained were analyzed using X-ray diffraction, elemental analysis, and Raman spectroscopy. To study their piezoresistive behavior, the resistivity of the resultant materials were measured as a function of applied stress. We found that the piezoresistive behavior of all materials can fit the tunneling-percolation model. The piezoresistive stress coefficient of the materials obtained at temperatures below 1200°C showed both reverse and logarithmical dependences on applied stress, but that of the materials obtained at higher temperatures showed only logarithmical dependence. We believe that the pyrolysis temperature induces a change in the free carbon structure thus, causing this effect on the piezoresistivity.
| Original language | English |
|---|---|
| Pages (from-to) | 359-362 |
| Number of pages | 4 |
| Journal | Journal of the American Ceramic Society |
| Volume | 94 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Feb 2011 |
| Externally published | Yes |
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