Abstract
The negative Goos-Hänchen shift (GHS) on a two-dimensional photonic crystal with an effective negative refractive index is investigated by simulation and experiment. The measured refractive index of the fabricated photonic crystal is nearly -0.44. The difference between the Goos-Hänchen shift of the transverse electric wave GTE and that of the transverse magnetic wave GTM (DGHS) in the height direction of a silicon rod is measured at three incident angles. The result shows that DGHS is always smaller than - GTM, thus GTE < 0; therefore, the negative GHS does occur on the surface of the photonic crystal with a negative refractive index.
| Original language | English |
|---|---|
| Pages (from-to) | 1213-1216 |
| Number of pages | 4 |
| Journal | Optics Letters |
| Volume | 42 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 1 Apr 2017 |
| Externally published | Yes |
Fingerprint
Dive into the research topics of 'Direct measurement of the negative Goos-Hänchen shift of single reflection in a two-dimensional photonic crystal with negative refractive index'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver