Skip to main navigation Skip to search Skip to main content

Direct measurement of the negative Goos-Hänchen shift of single reflection in a two-dimensional photonic crystal with negative refractive index

  • Qiang Jiang
  • , Jiabi Chen*
  • , Binming Liang
  • , Yan Wang
  • , Jinbing Hu
  • , Songlin Zhuang
  • *Corresponding author for this work
  • University of Shanghai for Science and Technology
  • Jiangxi Normal University

Research output: Contribution to journalArticlepeer-review

Abstract

The negative Goos-Hänchen shift (GHS) on a two-dimensional photonic crystal with an effective negative refractive index is investigated by simulation and experiment. The measured refractive index of the fabricated photonic crystal is nearly -0.44. The difference between the Goos-Hänchen shift of the transverse electric wave GTE and that of the transverse magnetic wave GTM (DGHS) in the height direction of a silicon rod is measured at three incident angles. The result shows that DGHS is always smaller than - GTM, thus GTE < 0; therefore, the negative GHS does occur on the surface of the photonic crystal with a negative refractive index.

Original languageEnglish
Pages (from-to)1213-1216
Number of pages4
JournalOptics Letters
Volume42
Issue number7
DOIs
Publication statusPublished - 1 Apr 2017
Externally publishedYes

Fingerprint

Dive into the research topics of 'Direct measurement of the negative Goos-Hänchen shift of single reflection in a two-dimensional photonic crystal with negative refractive index'. Together they form a unique fingerprint.

Cite this