Dielectric properties and resistance to fatigue failure of different barrier layers prepared on flexible stainless-steel foils by ion-beam assisted deposition

  • Yu Qiong Li
  • , Zhi Nong Yu*
  • , Jian Leng
  • , Hua Qing Wang
  • , She Chen
  • , Yu Hui Dong
  • , Gang Jin
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

A stainless-steel foil is an attractive candidate for the substrate of flexible display devices and integrated solar modules. For electrical insulation and ion diffusion reduction, a barrier layer should be coated on the stainless-steel foil surface. In this study, different barrier layers such as SiO x, TaO x, TiO x and TaO x/SiO x were prepared on the flexible stainless-steel foils (SUS 304) by ion-beam assisted deposition. The dielectric properties of the barrier layers, including resistance, reactance, leakage current density, breakdown field strength and performance index, were investigated. The resistance to fatigue failure of the barrier layers was evaluated by insulating tests after the specimen foils were flattened. The results show that the dielectric properties and the resistance to fatigue failure of the TaO x/SiO x composite barrier layer are better than those of the SiO x or the TaO x barrier layer. The best dielectric properties and resistance to fatigue failure are achieved with the 4-μm thick TaO x/SiO x composite barrier layer.

Original languageEnglish
Pages (from-to)6556-6560
Number of pages5
JournalThin Solid Films
Volume520
Issue number21
DOIs
Publication statusPublished - 31 Aug 2012
Externally publishedYes

Keywords

  • Barrier layer
  • Composite barrier
  • Dielectric properties
  • Fatigue testing
  • Ion beam assisted deposition
  • Metal oxides
  • Stainless-steel foil

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