TY - JOUR
T1 - Design method of off-axis extreme ultraviolet lithographic objective system with a direct tilt process
AU - Liu, Yan
AU - Li, Yanqiu
AU - Cao, Zhen
N1 - Publisher Copyright:
© 2015 Society of Photo-Optical Instrumentation Engineers (SPIE).
PY - 2015/7/1
Y1 - 2015/7/1
N2 - An off-axis extreme ultraviolet (EUV) lithographic objective can achieve a high numerical aperture (NA) beyond 0.33 with only six mirrors due to the efficient separation of the ray path, which greatly improves the resolution and energy utilization. A method is developed to design an off-axis lithographic objective with six mirrors. The method starts with a coaxial system with ray vignetting caused by increase of the NA. To avoid the ray vignetting, a reasonable range of solution for the tilt angle of each mirror is determined by real ray calculation. A set of optimal solutions for tilt angles of mirrors, which corresponds to the minimal composite root-mean-square wavefront error, is found from the reasonable ranges of solutions by a search program. In this way, an initial off-axis configuration without ray vignetting can be directly obtained and it is suitable for further optimization. To demonstrate the practicability of the method, an off-axis design example is given which shows that the presented method provides an efficient process to get to initial configuration for off-axis EUV lithographic objective with six mirrors.
AB - An off-axis extreme ultraviolet (EUV) lithographic objective can achieve a high numerical aperture (NA) beyond 0.33 with only six mirrors due to the efficient separation of the ray path, which greatly improves the resolution and energy utilization. A method is developed to design an off-axis lithographic objective with six mirrors. The method starts with a coaxial system with ray vignetting caused by increase of the NA. To avoid the ray vignetting, a reasonable range of solution for the tilt angle of each mirror is determined by real ray calculation. A set of optimal solutions for tilt angles of mirrors, which corresponds to the minimal composite root-mean-square wavefront error, is found from the reasonable ranges of solutions by a search program. In this way, an initial off-axis configuration without ray vignetting can be directly obtained and it is suitable for further optimization. To demonstrate the practicability of the method, an off-axis design example is given which shows that the presented method provides an efficient process to get to initial configuration for off-axis EUV lithographic objective with six mirrors.
KW - Extreme ultraviolet lithography
KW - Freeform surfaces
KW - Geometric optical design
KW - High numerical aperture
UR - http://www.scopus.com/inward/record.url?scp=84953923851&partnerID=8YFLogxK
U2 - 10.1117/1.OE.54.7.075102
DO - 10.1117/1.OE.54.7.075102
M3 - Article
AN - SCOPUS:84953923851
SN - 0091-3286
VL - 54
JO - Optical Engineering
JF - Optical Engineering
IS - 7
M1 - 075102
ER -