Abstract
Advancing high-voltage stability of layered sodium-ion oxides represents a pivotal avenue for their progress in energy storage applications. Despite this, a comprehensive understanding of the mechanisms underpinning their structural deterioration at elevated voltages remains insufficiently explored. In this study, we unveil a layer delamination phenomenon of Na0.67Ni0.3Mn0.7O2 (NNM) within the 2.0–4.3 V voltage, attributed to considerable volumetric fluctuations along the c-axis and lattice oxygen reactions induced by the simultaneous Ni3+/Ni4+ and anion redox reactions. By introducing Mg doping to diminished Ni–O antibonding, the anion oxidation-reduction reactions are effectively mitigated, and the structural integrity of the P2 phase remains firmly intact, safeguarding active sites and precluding the formation of novel interfaces. The Na0.67Mg0.05Ni0.25Mn0.7O2 (NMNM-5) exhibits a specific capacity of 100.7 mA h g−1, signifying an 83% improvement compared to the NNM material within the voltage of 2.0–4.3 V. This investigation underscores the intricate interplay between high-voltage stability and structural degradation mechanisms in layered sodium-ion oxides.
| Original language | English |
|---|---|
| Pages (from-to) | 1-9 |
| Number of pages | 9 |
| Journal | Journal of Energy Chemistry |
| Volume | 89 |
| DOIs | |
| Publication status | Published - Feb 2024 |
| Externally published | Yes |
Keywords
- Degradation analysis
- High-voltage performance
- Layer cathode materials
- P-type
- Soidum ion batteries
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