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Defect-Superstructure-Engineered Vanadium Dioxide Films for Electric-Field-Driven Phase Reconfiguration and Overload Protection

  • Junlin Yang
  • , Qianyi Li
  • , Shiqiao Liu
  • , Fangyuan Xing
  • , Xiaolong Li
  • , Chengzhi Wang
  • , Yong Li
  • , Haibo Jin
  • , Jingbo Li*
  • *Corresponding author for this work
  • Beijing Institute of Technology
  • Inner Mongolia University of Science and Technology
  • CAS - Shanghai Advanced Research Institute

Research output: Contribution to journalArticlepeer-review

Abstract

Electric-field-induced phase switching in vanadium dioxide (VO2) is central to its integration into adaptive electronic systems. However, the role of oxygen defects in governing structural stability and switching behavior remains insufficiently understood. Here, we engineer oxygen-deficient VO2 (VO2-δ) films to investigate the structure of VO2-δ and the electrical switching behavior systematically. The preferential occupation of oxygen vacancies was identified, which induces a 3-fold superstructure of (011)R and stacking faults with a certain degree of long-range ordering along (110)R and (020)R. Even so, the VO2-δ maintains the rutile-like coordination structure as VO2. Notably, the VO2-δ films exhibit high conductivity at room temperature. An irreversible metal–insulator transition can be triggered at 20 V for the VO2-δ film, enabled by localized Joule-heating-assisted reorganization of the oxygen-vacancy defect structure. The resulting abrupt resistance jump highlights the potential of VO2-δ as an ultrathin active medium for fast electronic overload protection. This work establishes vacancy ordering as a powerful lever for tailoring phase behavior in VO2, offering a defect-engineering pathway toward reconfigurable oxide electronic devices.

Original languageEnglish
Pages (from-to)6604-6614
Number of pages11
JournalChemistry of Materials
Volume38
Issue number13
DOIs
Publication statusPublished - 14 Jul 2026
Externally publishedYes

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