Deep Learning-Based Plasma Parameter Diagnostics Using Microwave Reflection

  • Jin Gang Liu
  • , Xiao Wei Huang*
  • , Xin Qing Sheng
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper presents a plasma parameter diagnostic method integrating microwave reflection and deep learning techniques. First, the Finite Element-Boundary IntegralMultilevel Fast Multipole Algorithm (FE-BI-MLFMA) is employed to generate high-accuracy training datasets. Then, a Plasma-Electromagnetic wave coupling network (PENet) is proposed to reconstruct plasma electron density efficiently by converting antenna reflection coefficients into image-based input features. This approach enhances the robustness of feature extraction and significantly improves inversion accuracy. Compared with traditional microwave diagnostic methods, the proposed method overcomes limitations in diagnosing electron density in complex plasma environments, substantially enhancing the understanding of electromagnetic phenomena around hypersonic vehicles and effectively supporting reliable operation of critical communication and detection systems.

Original languageEnglish
Title of host publicationIEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization for RF, Microwave, and Terahertz Applications, NEMO 2025 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331597993
DOIs
Publication statusPublished - 2025
Externally publishedYes
Event2025 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization for RF, Microwave, and Terahertz Applications, NEMO 2025 - Tianjin, China
Duration: 29 Jul 20251 Aug 2025

Publication series

NameIEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization for RF, Microwave, and Terahertz Applications, NEMO 2025 - Proceedings

Conference

Conference2025 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization for RF, Microwave, and Terahertz Applications, NEMO 2025
Country/TerritoryChina
CityTianjin
Period29/07/251/08/25

Keywords

  • Deep Learning
  • Electron Density
  • FE-BIMLFMA
  • Microwave Reflection
  • Plasma Diagnostics

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