Deep feature learning to quantitative prediction of software defects

Lei Qiao, Guangjie Li*, Daohua Yu, Hui Liu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Citations (Scopus)

Abstract

Defect prediction forecasts defect proneness or the number of defects contained in software systems. It is frequently employed to efficiently prioritize and allocate the limited testing resources to the modules that are more likely to be defective during the process of software development and maintenance. Consequently, a number of defect prediction approaches have been proposed. Most of the existing approaches on defect prediction regard defect prediction as a classification problem in which programs are classified as buggy or non-buggy. However, identifying the defect proneness of a given software module is not sufficient in practical software testing. The research on predicting the number of defects is limited and the performances of these approaches are constantly being optimized and improved. Therefore, in this paper, we propose a novel approach that leverages a convolutional neural network to predict the number of defects in software systems automatically. First, we preprocess the PROMISE dataset, which involves performing natural logarithm transformation and data normalization. Second, we feed the preprocessed dataset to a specially designed convolutional neural network-based model to predict the number of defects. Third, we rank the software modules according to the corresponding predicted number of defects in descending order. We also evaluate the proposed approach on a well-known dataset by cross-validation. The evaluation results suggest that the proposed approach is both accurate and robust, and it improves the state of the art. On average, it significantly improves the Kendall correlation coefficient by 16% and the fault-percentile-average by 4%.

Original languageEnglish
Title of host publicationProceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021
EditorsW. K. Chan, Bill Claycomb, Hiroki Takakura, Ji-Jiang Yang, Yuuichi Teranishi, Dave Towey, Sergio Segura, Hossain Shahriar, Sorel Reisman, Sheikh Iqbal Ahamed
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1401-1402
Number of pages2
ISBN (Electronic)9781665424639
DOIs
Publication statusPublished - Jul 2021
Event45th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2021 - Virtual, Online, Spain
Duration: 12 Jul 202116 Jul 2021

Publication series

NameProceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021

Conference

Conference45th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2021
Country/TerritorySpain
CityVirtual, Online
Period12/07/2116/07/21

Keywords

  • Convolutional neural network
  • Deep feature learning
  • Number of defects
  • Regression model
  • Software defect prediction
  • Software metrics

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