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Cs0.05(FA0.98MA0.02)0.95Pb(I0.98Br0.02)3-CMOS Image Sensor for Broadband (UV-Vis-NIR) Photodetection with 99.997% Pixel Functionality

  • Yunfei Xie
  • , Peng Sun
  • , Xuan Ye
  • , Zijian Pan
  • , Jiasheng Li
  • , Hao Ning
  • , Zhi Xiang Zhang
  • , Zongwen Li
  • , Qianqian Zhang
  • , Yongliang Xie
  • , Xiaochen Wang*
  • , Yan Jiang*
  • , Srikrishna Chanakya Bodepudi*
  • *Corresponding author for this work
  • College of Integrated Circuits
  • Zhejiang University
  • Beijing Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The integration of large-scale perovskite films with CMOS technology is crucial to unlock the full potential of broadband image sensing. Despite significant advances, challenges remain in achieving high functional pixel density, uniform film quality, and seamless integration with standard semiconductor processes. In this work, we present a breakthrough approach for depositing exceptionally uniform s0.05(FA0.98 MA0.02)0.95 Pb(I0.98 Br0.02)3 perovskite films onto CMOS chips using vacuum quenching. The resulting 640 × 512 pixel sensor achieves 99.997% of functional pixel density, with broadband ultraviolet-visible-near infrared (UV-Vis-NIR, 300nm-1000nm) response, attributed to excellent uniformity of perovskite films. Additionally, an on-chip broadband image fusion algorithm optimally merges data from the three spectral bands, improving image quality and detail extraction. This monolithic perovskite-CMOS integration approach provides a cost-effective solution for high-performance broadband imaging.

Original languageEnglish
Title of host publication2026 IEEE 26th International Conference on Nanotechnology, NANO 2026
PublisherIEEE Computer Society
Pages363-368
Number of pages6
ISBN (Electronic)9798319519481
DOIs
Publication statusPublished - 2026
Externally publishedYes
Event26th IEEE International Conference on Nanotechnology, NANO 2026 - Nanjing, China
Duration: 5 Jul 2026 → 8 Jul 2026

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
ISSN (Print)1944-9399
ISSN (Electronic)1944-9380

Conference

Conference26th IEEE International Conference on Nanotechnology, NANO 2026
Country/TerritoryChina
CityNanjing
Period5/07/26 → 8/07/26

Keywords

  • CMOS
  • Monolithic Integration
  • Multi-Spectral Imaging
  • Perovskite
  • Vacuum Quenching

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