Comparison of different lithographic source optimization methods based on compressive sensing

  • Zhiqiang Wang
  • , Xu Ma*
  • , Rui Chen*
  • , Gonzalo R. Arce
  • , Lisong Dong
  • , Hans Juergen Stock
  • , Yayi Wei
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Citations (Scopus)

Abstract

Source optimization (SO) is a widely used resolution enhancement technique to improve the imaging performance of optical lithography systems. Recently, a fast pixelated SO method for inverse lithography has been developed based on the theory of compressive sensing (CS). In last several years, CS has explored numerous reconstruction algorithms to solve for inverse problems. These algorithms are critical in attaining good reconstruction quality also aiming at reducing the time complexity. This paper compares different SO methods based on CS algorithms including the linearized Bregman (LB) algorithm, the alternating direction method of multipliers (ADMM), the fast iterative shrinkage-thresholding algorithm (FISTA), the approximate message-passing (AMP), and the gradient projection for sparse reconstruction (GPSR). Benefiting from the strategy of variable splitting and adaptive step size searching, the GPSR method effectively retains the optimization efficiency. Computational experiments also show that the GPSR method can achieve superior or comparable SO performance on average over other methods. It is also shown that the proposed SO methods can be applied to develop a fast source-mask optimization (SMO) method based on the CS framework.

Original languageEnglish
Title of host publicationOptical Microlithography XXXIII
EditorsSoichi Owa, Mark C. Phillips
PublisherSPIE
ISBN (Electronic)9781510634213
DOIs
Publication statusPublished - 2020
EventOptical Microlithography XXXIII 2020 - San Jose, United States
Duration: 25 Feb 202026 Feb 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11327
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Microlithography XXXIII 2020
Country/TerritoryUnited States
CitySan Jose
Period25/02/2026/02/20

Keywords

  • Compressive sensing (CS)
  • Computational lithography
  • Optical lithography
  • Source optimization (SO)
  • Source-mask optimization (SMO)

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