Skip to main navigation Skip to search Skip to main content

Chemical Inertness Dominated Intrinsic Safety: Unraveling the “Dissolution–Catalysis–Runaway” Mechanism in Sodium-Ion Battery Cathode Materials

  • Hangda Chen
  • , Jiaqi Shen
  • , Jianxiao Shen
  • , Wenjuan Zhang
  • , Hai Zu Jin
  • , Yong Wang
  • , Yuke Shen
  • , Haiying Che
  • , Linsen Li
  • , Chuying Ouyang*
  • , Kai Wu
  • , Zi Feng Ma*
  • *Corresponding author for this work
  • Shanghai Jiao Tong University
  • Contemporary Amperex Technology Co., Limited
  • Zhejiang Natrium Energy Co. Ltd.

Research output: Contribution to journalArticlepeer-review

Abstract

While pursuing high energy density in sodium-ion battery cathodes, ensuring intrinsic safety remains challenging. This study establishes a complete evidence chain linking “intrinsic chemical stability-metal dissolution-electrolyte catalytic decomposition-thermal safety” using NaNi1/3Fe1/3Mn1/3O2 (NFM), Na4Fe3(PO4)2(P2O7) (NFPP), and NaCrO2 (NCO) as models. We reveal that multivalent ions (Mn3+/Fe2+) in both NFM and NFPP trigger severe thermal runaway via a “dissolution-catalysis-runaway” cascade, despite their distinct structures. In contrast, NCO leverages the extreme chemical inertness of Cr3+ (unique d3 configuration and high Cr–O bond energy) to effectively sever this catalytic pathway, achieving counterintuitive high safety with minimal capacity sacrifice. This work elucidates that chemical inertness, rather than mere structural robustness, governs thermal safety, providing a new paradigm for designing intrinsically safe cathode materials.

Original languageEnglish
Pages (from-to)7167-7174
Number of pages8
JournalJournal of Physical Chemistry Letters
Volume17
Issue number25
DOIs
Publication statusPublished - 25 Jun 2026
Externally publishedYes

Fingerprint

Dive into the research topics of 'Chemical Inertness Dominated Intrinsic Safety: Unraveling the “Dissolution–Catalysis–Runaway” Mechanism in Sodium-Ion Battery Cathode Materials'. Together they form a unique fingerprint.

Cite this