Characterization of Electronic Transients by an Ultrafast Scanning Tunneling Microscope

Tian Lan*, Guo Qiang Ni

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

In this paper, we report experimental results of picosecond electrical transients pumped by ultrashort laser pulses on a coplanar strip line with an ultrafast scanning tunneling microscope. The resolved transient signal has a rise time in non-contact mode of 1.21 ps and the FWHM is 1.19 ps. Our measurements showed that the amplitude and the shape of the transient signals are independent of the magnitude and the polarity of the dc tunneling current, which confirms the capacitive coupling of the transient signal between the tip and the coplanar transmission line.

Original languageEnglish
Pages (from-to)617-620
Number of pages4
JournalInternational Journal of Nonlinear Sciences and Numerical Simulation
Volume3
Issue number3-4
DOIs
Publication statusPublished - 2002

Keywords

  • Scanning tunneling microscope
  • Transient measurements

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