Characteristic of interface effect in Cu-C60 granular films

Xiang Li; Y. J. Tang; H. W. Zhao; W. S. Zhan; Haiqian Wang; J. G. Hou

doi:10.1063/1.1287910

Characteristic of interface effect in Cu-C₆₀ granular films

Xiang Li^*
, Y. J. Tang
, H. W. Zhao
, W. S. Zhan
, Haiqian Wang
, J. G. Hou

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

In this letter, Cu-C₆₀ granular film is prepared with coevaporation method at room temperature. The conductance of the film is measured by in situ method, and its microstructure is characterized by transmission electron microscopy. The charge transfer from Cu to C₆₀ is investigated with Raman spectroscopy. The results indicate that the sample has the uniformly granular microstructure. The interaction between C₆₀ and Cu at the Cu-C₆₀ interfaces, which significantly affects the orientational order-disorder phase transition of C₆₀ and induces the phase transition of C₆₀ in the temperature range from 219 to 248 K. The mechanism of the characteristic of such phase transition is discussed.

Original language	English
Pages (from-to)	984-986
Number of pages	3
Journal	Applied Physics Letters
Volume	77
Issue number	7
DOIs	https://doi.org/10.1063/1.1287910
Publication status	Published - 14 Aug 2000
Externally published	Yes

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title = "Characteristic of interface effect in Cu-C60 granular films",

abstract = "In this letter, Cu-C60 granular film is prepared with coevaporation method at room temperature. The conductance of the film is measured by in situ method, and its microstructure is characterized by transmission electron microscopy. The charge transfer from Cu to C60 is investigated with Raman spectroscopy. The results indicate that the sample has the uniformly granular microstructure. The interaction between C60 and Cu at the Cu-C60 interfaces, which significantly affects the orientational order-disorder phase transition of C60 and induces the phase transition of C60 in the temperature range from 219 to 248 K. The mechanism of the characteristic of such phase transition is discussed.",

author = "Xiang Li and Tang, \{Y. J.\} and Zhao, \{H. W.\} and Zhan, \{W. S.\} and Haiqian Wang and Hou, \{J. G.\}",

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doi = "10.1063/1.1287910",

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TY - JOUR

T1 - Characteristic of interface effect in Cu-C60 granular films

AU - Li, Xiang

AU - Tang, Y. J.

AU - Zhao, H. W.

AU - Zhan, W. S.

AU - Wang, Haiqian

AU - Hou, J. G.

PY - 2000/8/14

Y1 - 2000/8/14

N2 - In this letter, Cu-C60 granular film is prepared with coevaporation method at room temperature. The conductance of the film is measured by in situ method, and its microstructure is characterized by transmission electron microscopy. The charge transfer from Cu to C60 is investigated with Raman spectroscopy. The results indicate that the sample has the uniformly granular microstructure. The interaction between C60 and Cu at the Cu-C60 interfaces, which significantly affects the orientational order-disorder phase transition of C60 and induces the phase transition of C60 in the temperature range from 219 to 248 K. The mechanism of the characteristic of such phase transition is discussed.

AB - In this letter, Cu-C60 granular film is prepared with coevaporation method at room temperature. The conductance of the film is measured by in situ method, and its microstructure is characterized by transmission electron microscopy. The charge transfer from Cu to C60 is investigated with Raman spectroscopy. The results indicate that the sample has the uniformly granular microstructure. The interaction between C60 and Cu at the Cu-C60 interfaces, which significantly affects the orientational order-disorder phase transition of C60 and induces the phase transition of C60 in the temperature range from 219 to 248 K. The mechanism of the characteristic of such phase transition is discussed.

UR - https://www.scopus.com/pages/publications/0001480578

U2 - 10.1063/1.1287910

DO - 10.1063/1.1287910

M3 - Article

AN - SCOPUS:0001480578

SN - 0003-6951

VL - 77

SP - 984

EP - 986

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 7

ER -

Characteristic of interface effect in Cu-C₆₀ granular films

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