Abstract
Super-resolution (SR) techniques are critical for enhancing image quality, particularly in scenarios where high-resolution imagery is essential yet limited by hardware constraints. Existing diffusion models for SR have relied predominantly on Gaussian models for noise generation, which often fall short when dealing with the complex and variable texture inherent in natural scenes. To address these deficiencies, we introduce the Bayesian Uncertainty Guided Diffusion Probabilistic Model (BUFF). BUFF distinguishes itself by incorporating a Bayesian network to generate high-resolution uncertainty masks. These masks guide the diffusion process, allowing for the adjustment of noise intensity in a manner that is both context-aware and adaptive. This novel approach not only enhances the fidelity of super-resolved images to their original high-resolution counterparts but also significantly mitigates artifacts and blurring in areas characterized by complex textures and fine details. The model demonstrates exceptional robustness against complex noise patterns and showcases superior adaptability in handling textures and edges within images. Empirical evidence, supported by visual results, illustrates the model’s robustness, especially in challenging scenarios, and its effectiveness in addressing common SR issues such as blurring. Experimental evaluations conducted on the DIV2K dataset reveal that BUFF achieves a notable improvement, with a +0.61 increase compared to baseline in SSIM on BSD100, surpassing traditional diffusion approaches by an average additional +0.20dB PSNR gain. These findings underscore the potential of Bayesian methods in enhancing diffusion processes for SR, paving the way for future advancements in the field.
Original language | English |
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Pages (from-to) | 3474-3482 |
Number of pages | 9 |
Journal | Proceedings of the AAAI Conference on Artificial Intelligence |
Volume | 39 |
Issue number | 4 |
DOIs | |
Publication status | Published - 11 Apr 2025 |
Externally published | Yes |
Event | 39th Annual AAAI Conference on Artificial Intelligence, AAAI 2025 - Philadelphia, United States Duration: 25 Feb 2025 → 4 Mar 2025 |