Abstract
Terahertz waves, with their unique penetrability and safety, hold significant potential in the field of non-destructive testing. However, the imaging process is susceptible to diffraction limits, noise, and system distortions, leading to degraded image quality. Traditional image restoration methods rely on known degradation models, which are difficult to apply to complex realworld degradation scenarios. This paper introduces blind image restoration technology, which simultaneously estimates the degradation model and the original image, effectively enhancing image resolution and fidelity. Experimental results indicate that this algorithm outperforms traditional methods in terms of noise suppression and image clarity, providing a higher-quality image restoration solution for terahertz non-destructive testing.
| Original language | English |
|---|---|
| Title of host publication | 2025 International Conference on Microwave and Millimeter Wave Technology, ICMMT 2025 - Proceedings |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Edition | 2025 |
| ISBN (Electronic) | 9798331525736 |
| DOIs | |
| Publication status | Published - 2025 |
| Event | 16th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2025 - Xi�an, China Duration: 19 May 2025 → 22 May 2025 |
Conference
| Conference | 16th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2025 |
|---|---|
| Country/Territory | China |
| City | Xi�an |
| Period | 19/05/25 → 22/05/25 |
Keywords
- Blind-Deconvolution
- Image Restoration
- Terahertz
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