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Blind-Deconvolution-Based Terahertz Image Restoration Algorithm

  • Yutong Li
  • , Weidong Hu*
  • , Zhen Tan
  • , Kai Qi Zhang
  • *Corresponding author for this work
  • Beijing Institute of Technology
  • Ministry of Industry and Information Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Terahertz waves, with their unique penetrability and safety, hold significant potential in the field of non-destructive testing. However, the imaging process is susceptible to diffraction limits, noise, and system distortions, leading to degraded image quality. Traditional image restoration methods rely on known degradation models, which are difficult to apply to complex realworld degradation scenarios. This paper introduces blind image restoration technology, which simultaneously estimates the degradation model and the original image, effectively enhancing image resolution and fidelity. Experimental results indicate that this algorithm outperforms traditional methods in terms of noise suppression and image clarity, providing a higher-quality image restoration solution for terahertz non-destructive testing.

Original languageEnglish
Title of host publication2025 International Conference on Microwave and Millimeter Wave Technology, ICMMT 2025 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Edition2025
ISBN (Electronic)9798331525736
DOIs
Publication statusPublished - 2025
Event16th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2025 - Xi�an, China
Duration: 19 May 202522 May 2025

Conference

Conference16th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2025
Country/TerritoryChina
CityXi�an
Period19/05/2522/05/25

Keywords

  • Blind-Deconvolution
  • Image Restoration
  • Terahertz

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