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Artificial Neural Network Modeling of Microwave Sensors for Dielectric Liquids Characterization

  • Giovanni Gugliandolo
  • , Zlatica Marinković
  • , Xiue Bao
  • , Cristiano De Marchis
  • , Filippo Battaglia
  • , Mariangela Latino
  • , Giuseppe Campobello
  • , Giovanni Crupi
  • , Nicola Donato
  • University of Messina
  • University of Nis

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The aim of this study is to develop a modeling procedure based on using artificial neural networks (ANNs) for predicting the frequency-dependent behavior of a microwave split-ring resonator (SRR) used for the dielectric characterization of liquid samples. The SRR device was designed and fabricated using the inkjet printing technology and, then, calibrated by means of water/ethanol mixtures with varying concentrations. By observing the variations in the forward transmission coefficient (i.e., S21) of the studied microwave device, a frequency shift of the resonant frequency and variations in the magnitude of S21 were recorded, which were related to the ethanol volume fraction. Using this calibration data, an ANN-based model is developed, which takes the ethanol volume fraction as input feature and, then, predicts the SRR sensor resonant parameters. The accuracy of the ANN-based model is reported and discussed.

Original languageEnglish
Title of host publication2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages401-405
Number of pages5
ISBN (Electronic)9798350300802
DOIs
Publication statusPublished - 2023
Event2nd Edition IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023 - Milano, Italy
Duration: 25 Oct 2023 → 27 Oct 2023

Publication series

Name2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023 - Proceedings

Conference

Conference2nd Edition IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023
Country/TerritoryItaly
CityMilano
Period25/10/23 → 27/10/23

Keywords

  • ANN
  • SRR
  • biological materials
  • dielectric characterization
  • liquids
  • microwave sensors
  • scattering parameter measurements

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