TY - JOUR
T1 - Arbitrary noise generator based on solid-state spin systems
AU - Zhang, Yifan
AU - Fu, Yue
AU - Zhang, Bo
N1 - Publisher Copyright:
© 2024 American Physical Society.
PY - 2024/12
Y1 - 2024/12
N2 - A controlled noise environment provides a unique platform for the investigation of various quantum technologies. Here, we demonstrate a technique to engineer arbitrary unitary baths in quantum systems with solid-state spin systems. A wide variety of classical noise models, including the generation of dephasing noise and amplitude-damping noise was realized through precise modulation of microwave signals. By measuring the power spectral density of the noise with the aid of single nitrogen-vacancy (N-V) color centers in diamond, we confirm that the generated noise closely matches the theoretical expectations. This technique serves as a powerful toolkit for validating quantum control protocols, simulating decoherence processes in other quantum systems, and generating baths essential for studying quantum thermodynamics.
AB - A controlled noise environment provides a unique platform for the investigation of various quantum technologies. Here, we demonstrate a technique to engineer arbitrary unitary baths in quantum systems with solid-state spin systems. A wide variety of classical noise models, including the generation of dephasing noise and amplitude-damping noise was realized through precise modulation of microwave signals. By measuring the power spectral density of the noise with the aid of single nitrogen-vacancy (N-V) color centers in diamond, we confirm that the generated noise closely matches the theoretical expectations. This technique serves as a powerful toolkit for validating quantum control protocols, simulating decoherence processes in other quantum systems, and generating baths essential for studying quantum thermodynamics.
UR - http://www.scopus.com/inward/record.url?scp=85210947255&partnerID=8YFLogxK
U2 - 10.1103/PhysRevApplied.22.064007
DO - 10.1103/PhysRevApplied.22.064007
M3 - Article
AN - SCOPUS:85210947255
SN - 2331-7019
VL - 22
JO - Physical Review Applied
JF - Physical Review Applied
IS - 6
M1 - 064007
ER -