@inproceedings{c9da209674be425ca1edb80d4ed1cb73,
title = "Anti-Counterfeit Scheme Using Monte Carlo Simulation for E-commerce in Cloud Systems",
abstract = "E-commerce using cloud-based trading platforms has become a popular approach with the growth of global development in recent years. However, the existence of counterfeits on the platform has threatened the benefits of all stakeholders. This paper proposes a novel scheme named Anti-Counterfeit Deterministic Prediction Model (ADPM), which is designed for detecting counterfeits by using Monte Carlo Model (MCM) to predict the potential malicious information in e-commerce. We consider the discriminations of the fake merchandises a crucial issue in preventing counterfeits on the online business platforms. The proposed mechanism provides a paradigm of machine-learning with using a novel algorithm that derives from MCM. The main algorithm used in our proposed mechanism is Monte Carlo Model-based Prediction Analysis Algorithm (M-PAA). Our experiment has evaluated that the proposed approach can provision the predictions of the insecure information in e-commerce.",
keywords = "Monte Carlo model, anti-counterfeit model, big data prediction, cloud systems, e-commerce",
author = "Keke Gai and Meikang Qiu and Hui Zhao and Wenyun Dai",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 2nd IEEE International Conference on Cyber Security and Cloud Computing, CSCloud 2015 ; Conference date: 03-11-2015 Through 05-11-2015",
year = "2016",
month = jan,
day = "4",
doi = "10.1109/CSCloud.2015.75",
language = "English",
series = "Proceedings - 2nd IEEE International Conference on Cyber Security and Cloud Computing, CSCloud 2015 - IEEE International Symposium of Smart Cloud, IEEE SSC 2015",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "74--79",
editor = "Tao Zhang and Das, {Sajal K.} and Tao Zhang and Meikang Qiu",
booktitle = "Proceedings - 2nd IEEE International Conference on Cyber Security and Cloud Computing, CSCloud 2015 - IEEE International Symposium of Smart Cloud, IEEE SSC 2015",
address = "United States",
}