Anomalous high capacitance in a coaxial single nanowire capacitor

  • Zheng Liu
  • , Yongjie Zhan
  • , Gang Shi
  • , Simona Moldovan
  • , Mohamed Gharbi
  • , Li Song
  • , Lulu Ma
  • , Wei Gao
  • , Jiaqi Huang
  • , Robert Vajtai
  • , Florian Banhart
  • , Pradeep Sharma
  • , Jun Lou*
  • , Pulickel M. Ajayan
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

51 Citations (Scopus)

Abstract

Building entire multiple-component devices on single nanowires is a promising strategy for miniaturizing electronic applications. Here we demonstrate a single nanowire capacitor with a coaxial asymmetric Cu-Cu 2 O-C structure, fabricated using a two-step chemical reaction and vapour deposition method. The capacitance measured from a single nanowire device corresponds to ∼140 μFcm2, exceeding previous reported values for metal-insulator-metal micro-capacitors and is more than one order of magnitude higher than what is predicted by classical electrostatics. Quantum mechanical calculations indicate that this unusually high capacitance may be attributed to a negative quantum capacitance of the dielectric-metal interface, enhanced significantly at the nanoscale.

Original languageEnglish
Article number879
JournalNature Communications
Volume3
DOIs
Publication statusPublished - 2012
Externally publishedYes

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