An overlapping technique to measure the parallelism of surface elements in a large area based on comparison goniometer

Zhi Shan Wang*, Yue Jin Zhao, Zhuo Li, Liquan Dong, Xuhong Chu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

Comparison goniometer, precision autocollimator, can be used to measure parallelism or angular error. If the size of the work piece to be measured is larger than the aperture of the objective lens, the measurement can not be carried through, because a part of work piece can't be observed. A new technique, called overlapping measurement technique, is proposed. The work piece will be moved, and two adjacent measurements must have an intercross. The relationship between the readings of the autocollimator and the angular error has been deduced. A program written in VC++6.0 will be used to process the measurement data.

Original languageEnglish
Title of host publicationInstrumentation, Metrology, and Standards for Nanomanufacturing IV
DOIs
Publication statusPublished - 2010
EventInstrumentation, Metrology, and Standards for Nanomanufacturing IV - San Diego, CA, United States
Duration: 2 Aug 20104 Aug 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7767
ISSN (Print)0277-786X

Conference

ConferenceInstrumentation, Metrology, and Standards for Nanomanufacturing IV
Country/TerritoryUnited States
CitySan Diego, CA
Period2/08/104/08/10

Keywords

  • Comparison goniometer
  • angular error
  • intercross
  • mirror surfaces
  • overlapping measurement technique
  • parallelism of surface
  • precision autocollimator
  • reflecting mirror

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