Abstract
We report a study of CuGa-In metallic precursors for chalcopyrite thin film.CuGa and In thin films were prepared by DC sputtering at room temperature.Due to low melting point of indium, the sputtering power on indium target was optimized.Then, CuGa and In multilayers were annealed at low temperature.At 120 C, the annealing treatment could enhance diffusion and alloying of CuGa and In layers; however, at 160 C, it caused a cohesion and crystalline of indium from the alloy which consequently formed irregular nodules on the film surface.The precursors were selenized to form copper indium gallium selenide (CIGS) thin films.The morphological and structural properties were investigated by scanning electron microscopy, X-ray diffraction and Raman spectra.The relationships between metallic precursors and CIGS films were discussed in the paper.A smooth precursor layer was the key factor to obtain a homogeneous and compact CIGS film.
| Original language | English |
|---|---|
| Pages (from-to) | 251-256 |
| Number of pages | 6 |
| Journal | Thin Solid Films |
| Volume | 545 |
| DOIs | |
| Publication status | Published - 31 Oct 2013 |
| Externally published | Yes |
Keywords
- Alloying Selenization
- Copper indium gallium selenide
- Indium
- Precursor films
- Scanning electron microscopy
- Sputtering
- X-ray diffraction
Fingerprint
Dive into the research topics of 'An optimized In-CuGa metallic precursors for chalcopyrite thin films'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver