An in situ end-point detection system using motor power signal for chemical mechanical planarization process

Hongkai Li, Tongqing Wang, Dewen Zhao, Jianbin Luo, Xinchun Lu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Citations (Scopus)

Abstract

Accurate determination of a chemical mechanical planarization (CMP) process reaching the end point is an important problem in the CMP process. In present work, the variation of the motor power signal of the polishing platen in the CMP process has been investigated, and the moving average method with 121-points moving window was used to smooth the original signal curve. Experiment results showed that the processed signal could facilitate the extraction of end-point feature for the in-situ end-point detection (EPD) system and it was relatively steady before and after the layer transition stage, which made it more reliable to detect the end point in situ. Comparing with other EPD methods, the system was less complicated, and it was easier to write algorithm code. Finally, further analysis was performed and series of experiments provided a planarized via-revealed wafer surface with low via dishing.

Original languageEnglish
Title of host publicationEngineering Tribology and Materials - ICETAT 2016
EditorsYunn Lin Hwang, Jeng Haur Horng
PublisherTrans Tech Publications Ltd.
Pages75-80
Number of pages6
ISBN (Print)9783035710762
DOIs
Publication statusPublished - 2017
Externally publishedYes
EventInternational Conference on Engineering Tribology and Applied Technology, ICETAT 2016 - Taipei, Taiwan, Province of China
Duration: 4 Nov 20166 Nov 2016

Publication series

NameKey Engineering Materials
Volume739 KEM
ISSN (Print)1013-9826
ISSN (Electronic)1662-9795

Conference

ConferenceInternational Conference on Engineering Tribology and Applied Technology, ICETAT 2016
Country/TerritoryTaiwan, Province of China
CityTaipei
Period4/11/166/11/16

Keywords

  • Chemical mechanical planarization
  • End-point detection
  • Motor power

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