An experimental study of the correlation between surface roughness and light scattering for rough metallic surfaces

Hongsong Li*, Kenneth E. Torrance

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

28 Citations (Scopus)

Abstract

We present an experimental study of the angular distribution of light scattered from several rough metallic surfaces, which cover a range of roughness conditions. The substrate materials are steel or glass; roughened by bead-blasting, grinding, or etching; and aluminum-coated. The measured surface-roughness statistics are filtered by using a composite roughness model. The raw mechanical roughnesses range from 0.21/μm to 2.66/ μum; the high-frequency small-scale roughnesses range from 0.13/μm to 0.86μm. The optical wavelength is 550nm, so that the roughness-to-wavelength ratio is of order one. A BRDF model based on the Kirchhoff approximation is used to establish a relationship between surface-height statistics and the angular distribution of the scattered light. Angular distributions calculated with the BRDF model are fit to the measurements. The best-fit roughness statistics from the BRDF model agree closely with those measured for the high-frequency small-scale roughness component. The latter roughness component, which has the highest surface slopes, is thus the primary contributor to the angular distribution of the reflected light. We show that the Kirchhoff approximation can be applied to rough metallic surfaces that have multiple scales of roughness and near-, but not perfect, Gaussian surface-height distributions.

Original languageEnglish
Article number58780V
Pages (from-to)1-15
Number of pages15
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5878
DOIs
Publication statusPublished - 2005
Externally publishedYes
EventAdvanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - San Diego, CA, United States
Duration: 2 Aug 20054 Aug 2005

Keywords

  • BRDF
  • Computer graphics
  • Kirchhoff approximation
  • Optics
  • Reflectance
  • Roughness
  • Scattering
  • Surfaces

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