An analytical dislocation multiple-pile-up model for the yield stress of fully lamellar TiAl alloys

Jun Yang; Gengkai Hu; Yonggang Zhang; Jilong Su

doi:10.1088/0965-0393/11/4/313

An analytical dislocation multiple-pile-up model for the yield stress of fully lamellar TiAl alloys

Jun Yang^*
, Gengkai Hu
, Yonggang Zhang
, Jilong Su

^*Corresponding author for this work

School of Aerospace Engineering

University of Alberta
Beihang University
Beijing Institute of Technology

Research output: Contribution to journal › Review article › peer-review

Abstract

An analytical dislocation multiple-pile-up model for yield stress of fully lamellar TiAl alloys was proposed. Numerical simulations showed that even when the grain size was fixed, different distributions of lamella sizes of different thickness influenced the yield stress. The proposed model agrees with the experimental results for fully lamellar TiAl alloys for relatively large lamellar thickness.

Original language	English
Pages (from-to)	627-634
Number of pages	8
Journal	Modelling and Simulation in Materials Science and Engineering
Volume	11
Issue number	4
DOIs	https://doi.org/10.1088/0965-0393/11/4/313
Publication status	Published - Jul 2003

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10.1088/0965-0393/11/4/313

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@article{a6cc32e5f483426a97115e3aba15f42c,

title = "An analytical dislocation multiple-pile-up model for the yield stress of fully lamellar TiAl alloys",

abstract = "An analytical dislocation multiple-pile-up model for yield stress of fully lamellar TiAl alloys was proposed. Numerical simulations showed that even when the grain size was fixed, different distributions of lamella sizes of different thickness influenced the yield stress. The proposed model agrees with the experimental results for fully lamellar TiAl alloys for relatively large lamellar thickness.",

author = "Jun Yang and Gengkai Hu and Yonggang Zhang and Jilong Su",

year = "2003",

month = jul,

doi = "10.1088/0965-0393/11/4/313",

language = "English",

volume = "11",

pages = "627--634",

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T1 - An analytical dislocation multiple-pile-up model for the yield stress of fully lamellar TiAl alloys

AU - Yang, Jun

AU - Hu, Gengkai

AU - Zhang, Yonggang

AU - Su, Jilong

PY - 2003/7

Y1 - 2003/7

N2 - An analytical dislocation multiple-pile-up model for yield stress of fully lamellar TiAl alloys was proposed. Numerical simulations showed that even when the grain size was fixed, different distributions of lamella sizes of different thickness influenced the yield stress. The proposed model agrees with the experimental results for fully lamellar TiAl alloys for relatively large lamellar thickness.

AB - An analytical dislocation multiple-pile-up model for yield stress of fully lamellar TiAl alloys was proposed. Numerical simulations showed that even when the grain size was fixed, different distributions of lamella sizes of different thickness influenced the yield stress. The proposed model agrees with the experimental results for fully lamellar TiAl alloys for relatively large lamellar thickness.

UR - https://www.scopus.com/pages/publications/0038781420

U2 - 10.1088/0965-0393/11/4/313

DO - 10.1088/0965-0393/11/4/313

M3 - Review article

AN - SCOPUS:0038781420

SN - 0965-0393

VL - 11

SP - 627

EP - 634

JO - Modelling and Simulation in Materials Science and Engineering

JF - Modelling and Simulation in Materials Science and Engineering

IS - 4

ER -

An analytical dislocation multiple-pile-up model for the yield stress of fully lamellar TiAl alloys

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