An abnormal photoluminescence enhancement in (Eu, Yb) Co-doped SiO 2 thin film

C. L. Heng; J. T. Li; Z. Han; P. G. Yin

doi:10.1080/10584587.2014.901125

An abnormal photoluminescence enhancement in (Eu, Yb) Co-doped SiO ₂ thin film

C. L. Heng^*
, J. T. Li
, Z. Han
, P. G. Yin

^*Corresponding author for this work

School of Physics

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

We report on the photoluminescence (PL) properties of europium (Eu) and ytterbium (Yb) co-doped SiO₂ thin film. The Eu (both Eu²⁺ and Eu³⁺) PL and the Yb³⁺ PL is co-related under different temperature annealing. However, upon 1100°C anneal, the Eu PL intensity is significantly stronger than other temperatures anneal. Transmission electron microscopy, X-ray photoelectron spectroscopy and X-ray diffraction results, suggest that meta-stable Eu²⁺-related silicates (EuSiO₃) have formed in the oxide as well as the formation of Yb₂Si ₂O₇.

Original language	English
Pages (from-to)	179-186
Number of pages	8
Journal	Integrated Ferroelectrics
Volume	151
Issue number	1
DOIs	https://doi.org/10.1080/10584587.2014.901125
Publication status	Published - 12 Feb 2014

Keywords

Rare earth co-doping
down-conversion luminescence
silicates

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10.1080/10584587.2014.901125

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abstract = "We report on the photoluminescence (PL) properties of europium (Eu) and ytterbium (Yb) co-doped SiO2 thin film. The Eu (both Eu2+ and Eu3+) PL and the Yb3+ PL is co-related under different temperature annealing. However, upon 1100°C anneal, the Eu PL intensity is significantly stronger than other temperatures anneal. Transmission electron microscopy, X-ray photoelectron spectroscopy and X-ray diffraction results, suggest that meta-stable Eu2+-related silicates (EuSiO3) have formed in the oxide as well as the formation of Yb2Si 2O7.",

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T1 - An abnormal photoluminescence enhancement in (Eu, Yb) Co-doped SiO 2 thin film

AU - Heng, C. L.

AU - Li, J. T.

AU - Han, Z.

AU - Yin, P. G.

PY - 2014/2/12

Y1 - 2014/2/12

N2 - We report on the photoluminescence (PL) properties of europium (Eu) and ytterbium (Yb) co-doped SiO2 thin film. The Eu (both Eu2+ and Eu3+) PL and the Yb3+ PL is co-related under different temperature annealing. However, upon 1100°C anneal, the Eu PL intensity is significantly stronger than other temperatures anneal. Transmission electron microscopy, X-ray photoelectron spectroscopy and X-ray diffraction results, suggest that meta-stable Eu2+-related silicates (EuSiO3) have formed in the oxide as well as the formation of Yb2Si 2O7.

AB - We report on the photoluminescence (PL) properties of europium (Eu) and ytterbium (Yb) co-doped SiO2 thin film. The Eu (both Eu2+ and Eu3+) PL and the Yb3+ PL is co-related under different temperature annealing. However, upon 1100°C anneal, the Eu PL intensity is significantly stronger than other temperatures anneal. Transmission electron microscopy, X-ray photoelectron spectroscopy and X-ray diffraction results, suggest that meta-stable Eu2+-related silicates (EuSiO3) have formed in the oxide as well as the formation of Yb2Si 2O7.

KW - Rare earth co-doping

KW - down-conversion luminescence

KW - silicates

UR - https://www.scopus.com/pages/publications/84901438917

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DO - 10.1080/10584587.2014.901125

M3 - Article

AN - SCOPUS:84901438917

SN - 1058-4587

VL - 151

SP - 179

EP - 186

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

IS - 1

ER -

An abnormal photoluminescence enhancement in (Eu, Yb) Co-doped SiO ₂ thin film

Abstract

Keywords

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