Advances in measurement of optical central thickness by low coherence interferometry

Zehao Tan; Yunpeng Feng; Zhong Wang

doi:10.7517/j.issn.1674-0475.2016.01.005

Advances in measurement of optical central thickness by low coherence interferometry

Zehao Tan, Yunpeng Feng^*, Zhong Wang

^*Corresponding author for this work

School of Optics and Photonics

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

With the advantages of high accuracy and fast speed, low coherence interferometry has broad prospects on non-contact measurement of optical system and biomedical imaging. By overviewing the important advances in simultaneous measurement of central thickness in lens system and describing the research status on biomedical imaging with OCT, we compare multiple research methods of low coherence interferometry by analyzing their innovation and finally prospect its development trend on new fields and improvements.

Original language	English
Pages (from-to)	1-14
Number of pages	14
Journal	Yingxiang Kexue yu Guanghuaxue/Imaging Science and Photochemistry
Volume	34
Issue number	1
DOIs	https://doi.org/10.7517/j.issn.1674-0475.2016.01.005
Publication status	Published - 1 Jan 2016

Keywords

Biomedical imaging
Lens thickness
Low coherence interferometry
OCT
non-contact measurement

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Advances in measurement of optical central thickness by low coherence interferometry

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