TY - GEN
T1 - Adaptive color independent components based SIFT descriptors for image classification
AU - Ai, Danni
AU - Han, Xianhua
AU - Ruan, Xiang
AU - Chen, Yen Wei
PY - 2010
Y1 - 2010
N2 - This paper proposes an adaptive color independent components based SIFT descriptor (termed CIC-SIFT) for image classification. Our motivation is to seek an adaptive and efficient color space for color SIFT feature extraction. Our work has two key contributions. First, based on independent component analysis (ICA), an adaptive and efficient color space is proposed for color image representation. Second, in this ICA-based color space, a discriminative CIC-SIFT descriptor is calculated for image classification. The experiment results indicate that (1) contrast between objects and background can be enhanced on the ICA-based color space and (2) the CIC-SIFT descriptor outperforms other conventional color SIFT descriptors on image classification.
AB - This paper proposes an adaptive color independent components based SIFT descriptor (termed CIC-SIFT) for image classification. Our motivation is to seek an adaptive and efficient color space for color SIFT feature extraction. Our work has two key contributions. First, based on independent component analysis (ICA), an adaptive and efficient color space is proposed for color image representation. Second, in this ICA-based color space, a discriminative CIC-SIFT descriptor is calculated for image classification. The experiment results indicate that (1) contrast between objects and background can be enhanced on the ICA-based color space and (2) the CIC-SIFT descriptor outperforms other conventional color SIFT descriptors on image classification.
UR - http://www.scopus.com/inward/record.url?scp=78149488772&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2010.596
DO - 10.1109/ICPR.2010.596
M3 - Conference contribution
AN - SCOPUS:78149488772
SN - 9780769541099
T3 - Proceedings - International Conference on Pattern Recognition
SP - 2436
EP - 2439
BT - Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
T2 - 2010 20th International Conference on Pattern Recognition, ICPR 2010
Y2 - 23 August 2010 through 26 August 2010
ER -