AB method in optical coatings

Hua Qing Wang; Wei Qiang Lu; Wei Xue; Zhi Nong Yu

AB method in optical coatings

Hua Qing Wang^*
, Wei Qiang Lu
, Wei Xue
, Zhi Nong Yu

^*Corresponding author for this work

School of Optics and Photonics

Beijing Institute of Technology

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

During the manufacture of optical coatings, to control the thickness of every layer is very important. Different monitoring methods may make different accuracy. AB method is much advanced in monitoring the thickness. Through the switch of monitoring glass and appropriate choice of wave length, stop point of each layer was located in sensitive position. With AB method, errors was cut in some degree and the influence of refractive index from many factors was lessened by revising stop points.

Original language	English
Pages (from-to)	413-415+418
Journal	Guangxue Jishu/Optical Technique
Volume	31
Issue number	SUPPL.
Publication status	Published - Sept 2005

Keywords

AB method
Linear correction of trigger point
Optical coatings

Cite this

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title = "AB method in optical coatings",

abstract = "During the manufacture of optical coatings, to control the thickness of every layer is very important. Different monitoring methods may make different accuracy. AB method is much advanced in monitoring the thickness. Through the switch of monitoring glass and appropriate choice of wave length, stop point of each layer was located in sensitive position. With AB method, errors was cut in some degree and the influence of refractive index from many factors was lessened by revising stop points.",

keywords = "AB method, Linear correction of trigger point, Optical coatings",

author = "Wang, \{Hua Qing\} and Lu, \{Wei Qiang\} and Wei Xue and Yu, \{Zhi Nong\}",

year = "2005",

month = sep,

language = "English",

volume = "31",

pages = "413--415+418",

journal = "Guangxue Jishu/Optical Technique",

issn = "1002-1582",

publisher = "Optical Technique",

number = "SUPPL.",

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TY - JOUR

T1 - AB method in optical coatings

AU - Wang, Hua Qing

AU - Lu, Wei Qiang

AU - Xue, Wei

AU - Yu, Zhi Nong

PY - 2005/9

Y1 - 2005/9

N2 - During the manufacture of optical coatings, to control the thickness of every layer is very important. Different monitoring methods may make different accuracy. AB method is much advanced in monitoring the thickness. Through the switch of monitoring glass and appropriate choice of wave length, stop point of each layer was located in sensitive position. With AB method, errors was cut in some degree and the influence of refractive index from many factors was lessened by revising stop points.

AB - During the manufacture of optical coatings, to control the thickness of every layer is very important. Different monitoring methods may make different accuracy. AB method is much advanced in monitoring the thickness. Through the switch of monitoring glass and appropriate choice of wave length, stop point of each layer was located in sensitive position. With AB method, errors was cut in some degree and the influence of refractive index from many factors was lessened by revising stop points.

KW - AB method

KW - Linear correction of trigger point

KW - Optical coatings

UR - https://www.scopus.com/pages/publications/27244456969

M3 - Article

AN - SCOPUS:27244456969

SN - 1002-1582

VL - 31

SP - 413-415+418

JO - Guangxue Jishu/Optical Technique

JF - Guangxue Jishu/Optical Technique

IS - SUPPL.

ER -

AB method in optical coatings

Abstract

Keywords

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