A reliable way of mechanical exfoliation of large scale two dimensional materials with high quality

In this work, we have developed a modified way of mechanical exfoliation for making two-dimensional materials by introducing a home-designed exfoliation machine. Optical microscopy was employed to identify the thin-layer (mono- and few-layer) flakes primarily. To testify the high efficiency of our modified exfoliation method, we did a simple statistical work on the exfoliation of graphene and WSe_2. Further, we used the Raman spectroscopy and the Atomic Force Microscopy (AFM) to characterize the samples. The results indicated the high quality of the as-fabricated samples. Finally, we developed an exfoliation technique for working with easily oxidizing samples. Our modified exfoliation method would be intriguing and innovative for fabricating two dimensional materials, providing a facile way for making electronic and optoelectronic devices.