A NIR scene simulation method based on reflection properties of target

Yang Huilei; Ding Yan; Zhang Zhemin

doi:10.1117/12.2012448

A NIR scene simulation method based on reflection properties of target

Yang Huilei, Ding Yan^*, Zhang Zhemin

^*Corresponding author for this work

School of Aerospace Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this paper, the spectral reflectance which ranges from 780nm to 1100nm for some typical targets is measured by using spectroradiometer. After the reflection properties analyzing, a near infrared (NIR) scene simulation method based on reflection properties of the typical target is presented. The experiment result shows the global features of NIR scene and laid the foundation of NIR scene simulation in future.

Original language	English
Title of host publication	Fifth International Conference on Machine Vision, ICMV 2012
Subtitle of host publication	Computer Vision, Image Analysis and Processing
DOIs	https://doi.org/10.1117/12.2012448
Publication status	Published - 2013
Event	5th International Conference on Machine Vision: Computer Vision, Image Analysis and Processing, ICMV 2012 - Wuhan, China Duration: 20 Oct 2012 → 21 Oct 2012

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	8783
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	5th International Conference on Machine Vision: Computer Vision, Image Analysis and Processing, ICMV 2012
Country/Territory	China
City	Wuhan
Period	20/10/12 → 21/10/12

Keywords

NIR
Reflection properties
Scene simulation

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10.1117/12.2012448

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@inproceedings{9e25472addb044c98109c7db74fed423,

title = "A NIR scene simulation method based on reflection properties of target",

abstract = "In this paper, the spectral reflectance which ranges from 780nm to 1100nm for some typical targets is measured by using spectroradiometer. After the reflection properties analyzing, a near infrared (NIR) scene simulation method based on reflection properties of the typical target is presented. The experiment result shows the global features of NIR scene and laid the foundation of NIR scene simulation in future.",

keywords = "NIR, Reflection properties, Scene simulation",

author = "Yang Huilei and Ding Yan and Zhang Zhemin",

year = "2013",

doi = "10.1117/12.2012448",

language = "English",

isbn = "9780819495877",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "Fifth International Conference on Machine Vision, ICMV 2012",

note = "5th International Conference on Machine Vision: Computer Vision, Image Analysis and Processing, ICMV 2012 ; Conference date: 20-10-2012 Through 21-10-2012",

}

Huilei, Y, Yan, D & Zhemin, Z 2013, A NIR scene simulation method based on reflection properties of target. in Fifth International Conference on Machine Vision, ICMV 2012: Computer Vision, Image Analysis and Processing., 87830A, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8783, 5th International Conference on Machine Vision: Computer Vision, Image Analysis and Processing, ICMV 2012, Wuhan, China, 20/10/12. https://doi.org/10.1117/12.2012448

A NIR scene simulation method based on reflection properties of target. / Huilei, Yang; Yan, Ding; Zhemin, Zhang.
Fifth International Conference on Machine Vision, ICMV 2012: Computer Vision, Image Analysis and Processing. 2013. 87830A (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8783).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A NIR scene simulation method based on reflection properties of target

AU - Huilei, Yang

AU - Yan, Ding

AU - Zhemin, Zhang

PY - 2013

Y1 - 2013

N2 - In this paper, the spectral reflectance which ranges from 780nm to 1100nm for some typical targets is measured by using spectroradiometer. After the reflection properties analyzing, a near infrared (NIR) scene simulation method based on reflection properties of the typical target is presented. The experiment result shows the global features of NIR scene and laid the foundation of NIR scene simulation in future.

AB - In this paper, the spectral reflectance which ranges from 780nm to 1100nm for some typical targets is measured by using spectroradiometer. After the reflection properties analyzing, a near infrared (NIR) scene simulation method based on reflection properties of the typical target is presented. The experiment result shows the global features of NIR scene and laid the foundation of NIR scene simulation in future.

KW - NIR

KW - Reflection properties

KW - Scene simulation

UR - https://www.scopus.com/pages/publications/84880238698

U2 - 10.1117/12.2012448

DO - 10.1117/12.2012448

M3 - Conference contribution

AN - SCOPUS:84880238698

SN - 9780819495877

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Fifth International Conference on Machine Vision, ICMV 2012

T2 - 5th International Conference on Machine Vision: Computer Vision, Image Analysis and Processing, ICMV 2012

Y2 - 20 October 2012 through 21 October 2012

ER -

A NIR scene simulation method based on reflection properties of target

Abstract

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Keywords

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