A new scene-based nonuniformity corrrection applied in boundary backward recursive reconstruction for arbitrary subpixel microscan

Yi Nan Chen*, Wei Qi Jin, Lei Zhao, Lin Zhao, Tan Wang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

A scene-based nonuiformity correction occurred in the operation of recursive reconstruction for high resolution extracted from subpixel microscan imaging (SMI) sequence are presented and analyzed. The reconstruction algorithm in terms of block-by-block method recursive from the prescient boundary to centre in uniform 2×2 SMI, is updated to the two-dimensional focus plane array (FPA) considering the arbitrary scan translation not equivalent to the accurate halfpixel. In this paper, the focus is concentrated to the nonuniform SMI model with fixed pattern noise (FPN), which corrupts the image by the gain and offset from the individual cell-detector. Then, we firstly demonstrate that once our backward recursive reconstruction implements to the undersampled sequence with FPN, the dramatic impact to the majority pixels is the elimination of the offset due to the quits efficiency by inverse iterative function in each 2×2 region belonging to the high resolution lattice. The final achievement is the nonuiformity correction (NUC) synchronously concomitant with the higher resolution, so our method fully takes account of the potential information of the scanned inter-frames. Application of proposed algorithm to the simulated SMI procedure has the obvious superiority, including the much better image quality indexes from the cleaned FPN, time-consumed saving within one scan period (4 frames), no requirements of statistical assumption so as to the avoidance of ghost artifact, and the inter-frames adaptive property.

Original languageEnglish
Title of host publicationInternational Symposium on Photoelectronic Detection and Imaging 2007
Subtitle of host publicationPhotoelectronic Imaging and Detection
DOIs
Publication statusPublished - 2008
EventInternational Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Photoelectronic Imaging and Detection - Beijing, China
Duration: 9 Sept 200712 Sept 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6621
ISSN (Print)0277-786X

Conference

ConferenceInternational Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Photoelectronic Imaging and Detection
Country/TerritoryChina
CityBeijing
Period9/09/0712/09/07

Keywords

  • Contraposition translation
  • Fixed pattern noise (FPN)
  • Infrared imaging
  • Non-uniform subpixel micro-scanning imaging (SMI)
  • Twice resolution

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