TY - JOUR
T1 - A new mobile grazing-incidence X-ray absorption fine spectroscopy endstation at Beijing Synchrotron Radiation Facility
AU - Yin, Zi
AU - Zhang, Guikai
AU - Xie, Yaning
AU - Chen, Yu
AU - Chu, Shengqi
AU - Shao, Cheng
AU - Song, Dongyan
AU - Zheng, Lirong
AU - An, Pengfei
AU - Zhang, Jing
N1 - Publisher Copyright:
© 2022, The Author(s), under exclusive licence to Institute of High Energy Physics, Chinese Academy of Sciences.
PY - 2022/6
Y1 - 2022/6
N2 - Purpose: A new mobile grazing-incidence X-ray absorption fine spectroscopy (GIXAFS) endstation was developed at Beijing Synchrotron Radiation Facility (BSRF) to improve the function of general XAFS beamlines and extend their capabilities to a wider user community. Methods: We developed a facile GIXAFS endstation through modifying the regular XAFS in grazing-incidence geometry. Additionally, a soller slit, filter, photographic film and tiny lead sheets were assembled to improve the signal-to-noise ratio of XAFS data. Furtherly, combined with time-resolved quick scanning XAFS (QXAFS) techniques, the systems can perform in situ XAFS measurement to study materials under operando condition. Results: The GIXAFS had been used to collect the Ga K-edge XAFS of InGaN thin film on sapphire substrate, which demonstrated that signal-to-noise ratio of XAFS data had been greatly improved through suppressing the effect of substrate diffractions. Moreover, the feasibility of GIXAFS-QXAFS combination was illustrated with in situ exploring the degradation of organic–inorganic perovskites under X-ray radiation. Conclusion: A new mobile and facile GIXAFS endstation has been developed for thin films study. Based on the photographic film and lead sheets, the contamination of the XAFS from the matrix is minimized. Further combined with QXAFS techniques, the systems are used to reveal the X-ray-induced organic–inorganic perovskite thin films photodegrading process, which proved their successful application in the time-resolved measurements, extending the capabilities of general beamlines available to a wider user community.
AB - Purpose: A new mobile grazing-incidence X-ray absorption fine spectroscopy (GIXAFS) endstation was developed at Beijing Synchrotron Radiation Facility (BSRF) to improve the function of general XAFS beamlines and extend their capabilities to a wider user community. Methods: We developed a facile GIXAFS endstation through modifying the regular XAFS in grazing-incidence geometry. Additionally, a soller slit, filter, photographic film and tiny lead sheets were assembled to improve the signal-to-noise ratio of XAFS data. Furtherly, combined with time-resolved quick scanning XAFS (QXAFS) techniques, the systems can perform in situ XAFS measurement to study materials under operando condition. Results: The GIXAFS had been used to collect the Ga K-edge XAFS of InGaN thin film on sapphire substrate, which demonstrated that signal-to-noise ratio of XAFS data had been greatly improved through suppressing the effect of substrate diffractions. Moreover, the feasibility of GIXAFS-QXAFS combination was illustrated with in situ exploring the degradation of organic–inorganic perovskites under X-ray radiation. Conclusion: A new mobile and facile GIXAFS endstation has been developed for thin films study. Based on the photographic film and lead sheets, the contamination of the XAFS from the matrix is minimized. Further combined with QXAFS techniques, the systems are used to reveal the X-ray-induced organic–inorganic perovskite thin films photodegrading process, which proved their successful application in the time-resolved measurements, extending the capabilities of general beamlines available to a wider user community.
KW - BSRF
KW - Grazing-incidence X-ray absorption spectroscopy
KW - High-quality data
KW - In situ
KW - Thin films
UR - http://www.scopus.com/inward/record.url?scp=85130252709&partnerID=8YFLogxK
U2 - 10.1007/s41605-022-00317-5
DO - 10.1007/s41605-022-00317-5
M3 - Article
AN - SCOPUS:85130252709
SN - 2509-9930
VL - 6
SP - 194
EP - 200
JO - Radiation Detection Technology and Methods
JF - Radiation Detection Technology and Methods
IS - 2
ER -