A method for measuring complicated deep-hole profile using line-structured-light sensor

  • Hui Wen Leng
  • , Chun Guang Xu*
  • , Ding Guo Xiao
  • , Dong Xing Wang
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

A 3D measurement system using line-structured-light sensor is proposed for the measurement of complicated deep-hole profile, which has the characteristics of both rapidity and high precision. System configuration, measurement principle and mathematical model along with the algorithm were presented. Combining morphological stripe-thinning algorithm with gray-scale barycenter algorithm, the stripe center locus could be extracted with accuracy in sub-pixel lever. Experiments were carried out to measure a complicated profile deep-hole with the length of 70 mm and the diameter of 130.0 mm. The results show that the masculine diameter measurement error is ±32 μm, while the feminine diameter measurement error is ±54 μm.

Original languageEnglish
Pages (from-to)139-143
Number of pages5
JournalBeijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology
Volume33
Issue number2
Publication statusPublished - Feb 2013

Keywords

  • Complicated deep-hole
  • Gray-scale barycenter
  • Line-structured-light
  • Stripe thinning
  • Three-dimensions measurement

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