@inproceedings{9cf1dc302b0d4b71bdc170c0fa76b2a4,
title = "A light efficiency uniformity detection system for medical rigid endoscope based on image processing",
abstract = "Light efficiency uniformity is a very important parameter of medical rigid endoscope. This paper introduces a new system based on image processing to test the light efficiency uniformity of medical rigid endoscope. Employing an electric machinery to reduce the human intervention, so that the precision of measuring and automation degree are improved. We collect the image with a digital CCD camera and display it on the screen of a computer, which can avoid visual fatigue from the direct observation through the rigid endoscope. To perform the image processing on a computer, we adopt a self-developed image processing software, by which the test results can be obtained from PC itself. The processes of our self-developed image processing software include: gray-scale transformation, image pretreatment and image binarization; calculate the center and equivalent radius of the field of view (FOV); plot the curve, through which the ratio of edge and center in different field and the center axisymmetric of light efficiency can be both calculated. It concludes that the relative self-effect of illumination light luminosity is the foremost factor affecting the uniformity, and these endoscopes are all qualified with the max deviation of the center axisymmetric less than 20\%. The results of our study prove that this system can test the light efficiency uniformity of medical rigid endoscope quickly, expediently and accurately, and it contains more information instead of only reflecting a particular field of the FOV, what's more, it applies to different types, length and angles of view of medical rigid endoscope.",
keywords = "Synthetically relative effect of edge light energy, center axisymmetric, field of view (FOV), image processing, light efficiency uniformity, medical rigid endoscope, plot curve",
author = "Yakun Wang and Ming Liu and Xiaohua Liu and Yuejin Zhao and Liquan Dong and Mei Hui and Xiaohao Zhai and Yonghui Li and Peng Zhou",
note = "Publisher Copyright: {\textcopyright} 2015 SPIE.; 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, OIT 2015 ; Conference date: 17-05-2015 Through 19-05-2015",
year = "2015",
doi = "10.1117/12.2193136",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Kexin Xu and Hai Xiao and Jigui Zhu and Hwa-Yaw Tam and Sen Han",
booktitle = "2015 International Conference on Optical Instruments and Technology",
address = "United States",
}