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A High-Sensitivity Electric Field Sensor Based on Nonlinear Frequency Difference in a Clamped-Clamped Beam Resonator

  • Weiyang Li
  • , Pinyi Li
  • , Najib Kacem
  • , Jianhua Li
  • , Xiaolong Wen*
  • , Ashwin A. Seshia
  • *Corresponding author for this work
  • University of Science and Technology Beijing
  • FEMTO-ST
  • University of Cambridge

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work, we propose a quasi-digital readout scheme for frequency-modulated (FM) resonant micro-electric field sensors (MEFS) by leveraging the nonlinear hysteresis loop width - specifically, the frequency difference between the forward and backward sweep bifurcation points. In the linear regime, the frequency shift exhibits a quadratic dependence on the electric field, with sensitivities of 0.085√Hz/kV/m) for lateral perturbation and 0.037√Hz/(kV/m) for axial perturbation. By operating in the nonlinear regime and utilizing the frequency difference as the output metric, the sensor achieves a sensitivity of 0.629Hz/(kV/m) with a direct linear response to the applied electric field. This represents a substantial improvement in sensitivity compared to conventional linear-regime operation. This work provides a novel approach for achieving high-sensitivity measurements in frequency-modulated MEFS.

Original languageEnglish
Title of host publication2026 IEEE 21st International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2026
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages311-314
Number of pages4
ISBN (Electronic)9798319519351
DOIs
Publication statusPublished - 2026
Externally publishedYes
Event21st IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2026 - Chengdu, China
Duration: 17 Apr 202621 Apr 2026

Publication series

Name2026 IEEE 21st International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2026

Conference

Conference21st IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2026
Country/TerritoryChina
CityChengdu
Period17/04/2621/04/26

Keywords

  • Electric field sensors
  • MEMS
  • Nonlinear dynamics
  • frequency output

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