TY - JOUR
T1 - A high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI
AU - Jiang, Yi
AU - Tang, Caijie
PY - 2008/6/1
Y1 - 2008/6/1
N2 - A white-light interferometry-based high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI is demonstrated. The phase difference between the two white-light optical spectra is calculated by a Fourier- transform-based technique. From this phase difference, the difference in cavity length between the two EFPIs is calculated. This, in turn, is used to measure strain. A strain resolution of 8.27 × 10-3 νε is achieved.
AB - A white-light interferometry-based high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI is demonstrated. The phase difference between the two white-light optical spectra is calculated by a Fourier- transform-based technique. From this phase difference, the difference in cavity length between the two EFPIs is calculated. This, in turn, is used to measure strain. A strain resolution of 8.27 × 10-3 νε is achieved.
KW - Extrinsic Fabry-Perot interferometer
KW - Fiber-optical sensors
KW - Fourier transform
KW - White-light interferometry
UR - https://www.scopus.com/pages/publications/46749132343
U2 - 10.1088/0957-0233/19/6/065304
DO - 10.1088/0957-0233/19/6/065304
M3 - Article
AN - SCOPUS:46749132343
SN - 0957-0233
VL - 19
JO - Measurement Science and Technology
JF - Measurement Science and Technology
IS - 6
M1 - 065304
ER -