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A Formal Verification Approach for Measures of Effectiveness Based on Satisfiability Modulo Theories

  • Yongji Yuan
  • , Guoxin Wang*
  • , Yihui Gong
  • , Jinzhi Lu
  • , Shouxuan Wu*
  • , Mengru Dong
  • *Corresponding author for this work
  • Beijing Institute of Technology
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Model-Based Systems Engineering (MBSE) provides a formal and integrated framework for managing multidisciplinary information throughout the system design lifecycle. Within this framework, Measures of Effectiveness (MOEs) serve as the key quantitative metrics for evaluating whether a system design meets mission requirements. Current approaches for verifying MOE constraints in MBSE typically rely on mathematical relationships established through SysML parametric diagrams, with metrics analysis performed using built-in computational plug-ins or external specialized software. However, these approaches face challenges in unified representation of multitheory hybrid constraints, automated exploration for feasible solutions, and tool-level data consistency. This limits the reliability and completeness of verification results. This paper proposes a formal verification approach for MOE by integrating the multi-architecture modeling language KARMA with Satisfiability Modulo Theories (SMT). The approach provides a unified firstorder logic (FOL) representation of MOE-related metrics. It also automates the evaluation of SysML parametric diagrams through SMT solver, enabling constraint satisfiability checking and reverse derivation of optimal design solutions. A satellite electric power system (EPS) case study demonstrates the feasibility and effectiveness of the proposed approach. The results show that the approach ensures the consistency between system metrics and requirements, and improves automation and completeness of MOE verification within the MBSE framework.

Original languageEnglish
Title of host publicationSysCon 2026 - The 20th Annual IEEE International Systems Conference, Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331591519
DOIs
Publication statusPublished - 2026
Externally publishedYes
Event20th Annual IEEE International Systems Conference, SysCon 2026 - Halifax, Canada
Duration: 6 Apr 20269 Apr 2026

Publication series

NameSysCon 2026 - The 20th Annual IEEE International Systems Conference, Conference Proceedings

Conference

Conference20th Annual IEEE International Systems Conference, SysCon 2026
Country/TerritoryCanada
CityHalifax
Period6/04/269/04/26

Keywords

  • Formal verification
  • KARMA
  • MBSE
  • Measures of Effectiveness
  • Satisfiability Modulo Theories

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