A Digital System for High-Speed Measurement of Capacitance under Transient Stress Impact

Mian Jiang, Yabin Wang, Xiangqun Cheng*, Kaixin Guo, Ziming Li, Fang Guo

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Multilayer ceramic capacitors (MLCCs) are often used in transient high stress impact scenarios, with a stress impact pulse width of sub milliseconds. In order to study the dynamic characteristics of MLCCs under impact stress, it is necessary to obtain the capacitance and its variation of MLCCs during the stress action time. This paper designs a digital system for high-speed capacitance measurement, which can obtain the transient voltage of MLCC and store it in non-volatile memory. A prototype was designed with a data conversion period of 160ns. The functionality of the prototype was verified through Hopkinson pressure bar impact experiment. The transient capacitance of MLCC was calculated based on the transient voltage value, achieving high-speed and accurate measurement of capacitance.

Original languageEnglish
Title of host publication2024 6th International Conference on Circuits and Systems, ICCS 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages118-123
Number of pages6
ISBN (Electronic)9798350352153
DOIs
Publication statusPublished - 2024
Event6th International Conference on Circuits and Systems, ICCS 2024 - Chengdu, China
Duration: 20 Sept 202423 Sept 2024

Publication series

Name2024 6th International Conference on Circuits and Systems, ICCS 2024

Conference

Conference6th International Conference on Circuits and Systems, ICCS 2024
Country/TerritoryChina
CityChengdu
Period20/09/2423/09/24

Keywords

  • FPGA
  • High-speed acquisition
  • Real-time storage
  • Transient high stress impact

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