A Combination of BIM and BEM for efficiently analyzing optical elements

Fang Sun; Juan Liu; Guo Ting Zhang; Chuan Fei Hu; Xiaoxing Su

doi:10.1117/12.791101

A Combination of BIM and BEM for efficiently analyzing optical elements

Fang Sun^*, Juan Liu, Guo Ting Zhang, Chuan Fei Hu, Xiaoxing Su

^*Corresponding author for this work

Beijing Jiaotong University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We propose the revised boundary integral method (RBIM) that combines the boundary integral method (BIM) and the boundary element method (BEM) together. It is well known that the boundary integral equations are cast into matrix form for ease of computer implementation, and the points on the diagonal line of the matrix present the superposition of the observation and the source points. The points are called singularity points which can cause the big error bar. Thus, we consider replacing the BIM by the BEM at the diagonal line, comparing the numerical results by using the RBIM, the BIM, the BEM, and the analytical method, and find the error bar caused by the RBIM is smaller than that of the BIM. It indicates that the RBIM is not only faster than the BEM, but also it is preciser than BIM.

Original language	English
Title of host publication	International Symposium on Photoelectronic Detection and Imaging 2007
Subtitle of host publication	Optoelectronic System Design, Manufacturing, and Testing
DOIs	https://doi.org/10.1117/12.791101
Publication status	Published - 2008
Externally published	Yes
Event	International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings - Beijing, China Duration: 9 Sept 2007 → 12 Sept 2007

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	6624
ISSN (Print)	0277-786X

Conference

Conference	International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings
Country/Territory	China
City	Beijing
Period	9/09/07 → 12/09/07

Keywords

Boundary element method (BEM)
Boundary integral method (BIM)
Revised boundary integral method (RBIM)

Access to Document

10.1117/12.791101

Cite this

Sun, F., Liu, J., Zhang, G. T., Hu, C. F., & Su, X. (2008). A Combination of BIM and BEM for efficiently analyzing optical elements. In International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing Article 662411 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6624). https://doi.org/10.1117/12.791101

@inproceedings{361cbc7cbc6b4d1e8105dc8999e783c1,

title = "A Combination of BIM and BEM for efficiently analyzing optical elements",

abstract = "We propose the revised boundary integral method (RBIM) that combines the boundary integral method (BIM) and the boundary element method (BEM) together. It is well known that the boundary integral equations are cast into matrix form for ease of computer implementation, and the points on the diagonal line of the matrix present the superposition of the observation and the source points. The points are called singularity points which can cause the big error bar. Thus, we consider replacing the BIM by the BEM at the diagonal line, comparing the numerical results by using the RBIM, the BIM, the BEM, and the analytical method, and find the error bar caused by the RBIM is smaller than that of the BIM. It indicates that the RBIM is not only faster than the BEM, but also it is preciser than BIM.",

keywords = "Boundary element method (BEM), Boundary integral method (BIM), Revised boundary integral method (RBIM)",

author = "Fang Sun and Juan Liu and Zhang, {Guo Ting} and Hu, {Chuan Fei} and Xiaoxing Su",

year = "2008",

doi = "10.1117/12.791101",

language = "English",

isbn = "9780819467669",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "International Symposium on Photoelectronic Detection and Imaging 2007",

note = "International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings ; Conference date: 09-09-2007 Through 12-09-2007",

}

Sun, F, Liu, J, Zhang, GT, Hu, CF & Su, X 2008, A Combination of BIM and BEM for efficiently analyzing optical elements. in International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing., 662411, Proceedings of SPIE - The International Society for Optical Engineering, vol. 6624, International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, Beijing, China, 9/09/07. https://doi.org/10.1117/12.791101

A Combination of BIM and BEM for efficiently analyzing optical elements. / Sun, Fang; Liu, Juan; Zhang, Guo Ting et al.
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing. 2008. 662411 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6624).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A Combination of BIM and BEM for efficiently analyzing optical elements

AU - Sun, Fang

AU - Liu, Juan

AU - Zhang, Guo Ting

AU - Hu, Chuan Fei

AU - Su, Xiaoxing

PY - 2008

Y1 - 2008

N2 - We propose the revised boundary integral method (RBIM) that combines the boundary integral method (BIM) and the boundary element method (BEM) together. It is well known that the boundary integral equations are cast into matrix form for ease of computer implementation, and the points on the diagonal line of the matrix present the superposition of the observation and the source points. The points are called singularity points which can cause the big error bar. Thus, we consider replacing the BIM by the BEM at the diagonal line, comparing the numerical results by using the RBIM, the BIM, the BEM, and the analytical method, and find the error bar caused by the RBIM is smaller than that of the BIM. It indicates that the RBIM is not only faster than the BEM, but also it is preciser than BIM.

AB - We propose the revised boundary integral method (RBIM) that combines the boundary integral method (BIM) and the boundary element method (BEM) together. It is well known that the boundary integral equations are cast into matrix form for ease of computer implementation, and the points on the diagonal line of the matrix present the superposition of the observation and the source points. The points are called singularity points which can cause the big error bar. Thus, we consider replacing the BIM by the BEM at the diagonal line, comparing the numerical results by using the RBIM, the BIM, the BEM, and the analytical method, and find the error bar caused by the RBIM is smaller than that of the BIM. It indicates that the RBIM is not only faster than the BEM, but also it is preciser than BIM.

KW - Boundary element method (BEM)

KW - Boundary integral method (BIM)

KW - Revised boundary integral method (RBIM)

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U2 - 10.1117/12.791101

DO - 10.1117/12.791101

M3 - Conference contribution

AN - SCOPUS:41149113515

SN - 9780819467669

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - International Symposium on Photoelectronic Detection and Imaging 2007

T2 - International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings

Y2 - 9 September 2007 through 12 September 2007

ER -

A Combination of BIM and BEM for efficiently analyzing optical elements

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