A Combination of BIM and BEM for efficiently analyzing optical elements

Fang Sun*, Juan Liu, Guo Ting Zhang, Chuan Fei Hu, Xiaoxing Su

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We propose the revised boundary integral method (RBIM) that combines the boundary integral method (BIM) and the boundary element method (BEM) together. It is well known that the boundary integral equations are cast into matrix form for ease of computer implementation, and the points on the diagonal line of the matrix present the superposition of the observation and the source points. The points are called singularity points which can cause the big error bar. Thus, we consider replacing the BIM by the BEM at the diagonal line, comparing the numerical results by using the RBIM, the BIM, the BEM, and the analytical method, and find the error bar caused by the RBIM is smaller than that of the BIM. It indicates that the RBIM is not only faster than the BEM, but also it is preciser than BIM.

Original languageEnglish
Title of host publicationInternational Symposium on Photoelectronic Detection and Imaging 2007
Subtitle of host publicationOptoelectronic System Design, Manufacturing, and Testing
DOIs
Publication statusPublished - 2008
Externally publishedYes
EventInternational Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings - Beijing, China
Duration: 9 Sept 200712 Sept 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6624
ISSN (Print)0277-786X

Conference

ConferenceInternational Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings
Country/TerritoryChina
CityBeijing
Period9/09/0712/09/07

Keywords

  • Boundary element method (BEM)
  • Boundary integral method (BIM)
  • Revised boundary integral method (RBIM)

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