TY - GEN
T1 - A 1.2GS/s 11b Time-Interleaved SAR ADC with Low-Cost Derivative-Based Background Timing-Skew Calibration and Variable-Load Comparators
AU - Gu, Mingyang
AU - Tao, Yunsong
AU - He, Xiyu
AU - Zhong, Yi
AU - Jie, Lu
AU - Sun, Nan
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - Time-interleaved (TI) SARs are popular choices for high-speed ADCs due to their high energy efficiency and scaling compatibility, but they suffer from timing skew that severely degrades the linearity. The key to the background calibration of the timing skew error Δt is to correctly estimate its sign, so that Δt can be minimized by adjusting a variable delay line. One way to estimate sgn(Δt) is to add a reference ADC channel (ref-ADC) and compare its output Dref with each sub-ADC channel output Di to obtain ΔVin=Di-Dref. However, without knowing the input derivative dVin/dt, the estimation of sgn(Δt) relies on computing auto-correlation or variance, which takes millions or even billions of samples to converge [1]. Thus, it is preferred to extract both Δ Vin and dVin/dt, which allows the direct solving of sgn(Δt)=sgn(Δ Vin · d Vin/dt) and achieves a fast convergence. The derivative can be estimated by using a digital FIR filter, but it is computationally intensive and limits the input bandwidth [2]. It can also be extracted by adding another channel to build an analog derivative filter [3] [4]. This approach supports wide input bandwidth, but two extra channels result in large area and power overhead. To minimize the cost, this paper proposes a novel timing-skew calibration technique that uses only one extra channel to extract both ΔVin and dVin/dt, achieving low-cost and fast calibration. Dummy loads are used to compensate the impedance modulation effect. This paper also proposes a novel variable-load comparator. It outperforms the conventional design in both speed and energy efficiency. Equipped with the proposed calibration technique and comparators, a prototype 1.2GS/s 11b TI SAR ADC with an on-chip timing-skew calibration engine achieves 58.4 dB SNDR while consuming only 4.6 mW, leading to a competitive FoMs of 169.6 dB and FoMw of 5.6fJ/conv-step.
AB - Time-interleaved (TI) SARs are popular choices for high-speed ADCs due to their high energy efficiency and scaling compatibility, but they suffer from timing skew that severely degrades the linearity. The key to the background calibration of the timing skew error Δt is to correctly estimate its sign, so that Δt can be minimized by adjusting a variable delay line. One way to estimate sgn(Δt) is to add a reference ADC channel (ref-ADC) and compare its output Dref with each sub-ADC channel output Di to obtain ΔVin=Di-Dref. However, without knowing the input derivative dVin/dt, the estimation of sgn(Δt) relies on computing auto-correlation or variance, which takes millions or even billions of samples to converge [1]. Thus, it is preferred to extract both Δ Vin and dVin/dt, which allows the direct solving of sgn(Δt)=sgn(Δ Vin · d Vin/dt) and achieves a fast convergence. The derivative can be estimated by using a digital FIR filter, but it is computationally intensive and limits the input bandwidth [2]. It can also be extracted by adding another channel to build an analog derivative filter [3] [4]. This approach supports wide input bandwidth, but two extra channels result in large area and power overhead. To minimize the cost, this paper proposes a novel timing-skew calibration technique that uses only one extra channel to extract both ΔVin and dVin/dt, achieving low-cost and fast calibration. Dummy loads are used to compensate the impedance modulation effect. This paper also proposes a novel variable-load comparator. It outperforms the conventional design in both speed and energy efficiency. Equipped with the proposed calibration technique and comparators, a prototype 1.2GS/s 11b TI SAR ADC with an on-chip timing-skew calibration engine achieves 58.4 dB SNDR while consuming only 4.6 mW, leading to a competitive FoMs of 169.6 dB and FoMw of 5.6fJ/conv-step.
UR - https://www.scopus.com/pages/publications/85218215882
U2 - 10.1109/A-SSCC60305.2024.10849123
DO - 10.1109/A-SSCC60305.2024.10849123
M3 - Conference contribution
AN - SCOPUS:85218215882
T3 - 2024 IEEE Asian Solid-State Circuits Conference, A-SSCC 2024
BT - 2024 IEEE Asian Solid-State Circuits Conference, A-SSCC 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2024 IEEE Asian Solid-State Circuits Conference, A-SSCC 2024
Y2 - 18 November 2024 through 21 November 2024
ER -