3D localization of point source based on light field imaging and deep learning

  • Shizhu Yuan
  • , Yao Hu*
  • , Rui Cao
  • , Chengqiang Xu
  • , Qun Hao
  • , Xuemin Cheng
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

3D localization of point source is widely used in many fields, such as bioimaging and autonomous driving fields. However, the localization is hard to perform under scattering conditions because of the diffuse effect of the scattering. We propose a novel method for 3D localization of point source under scattering conditions based on light field imaging and deep learning by only one shot. First, we introduce the description of the point source in a light field wise and how to localize a point source by its light field. On the basis, we elaborate on the effect of scattering on a light field and how to retrieve the location of a point source from a light field with scattering. Then, the effect of aberration on a light field will be introduced. We also build an artificial scene and a deep learning framework to perform a 3D localization practically, and the feasibility and accuracy of our method have been evaluated.

Original languageEnglish
Title of host publication2019 International Conference on Optical Instruments and Technology
Subtitle of host publicationOptoelectronic Imaging/Spectroscopy and Signal Processing Technology
EditorsGuohai Situ, Xun Cao, Wolfgang Osten
PublisherSPIE
ISBN (Electronic)9781510636545
DOIs
Publication statusPublished - 2020
Event2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology - Beijing, China
Duration: 26 Oct 201928 Oct 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11438
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
Country/TerritoryChina
CityBeijing
Period26/10/1928/10/19

Keywords

  • Deep learning
  • Light field imaging
  • Point localization
  • Scattering

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