同时表征短程/长程序结构的同步辐射X射线吸收谱/衍射联用装置新进展: 多功能原位池的研制

The synchrotron X-ray absorption spectroscopy (XAS)/diffraction (XRD) combined device can simultaneously characterize the short- and long-range-ordered structures of substances. To promote the development of the combined device, versatile in-situ cells are developed, which provides a variety of in-situ sample environments such as temperature, pressure and atmosphere for the study of catalytic reaction mechanism, functional material growth mechanism and its stability. Furthermore, the synchronization of X-ray absorption fine structure (XAFS)/XRD data acquisition and sample environment control is achieved through an external trigger. The device is successfully applied to track the structure evolution of nano-MAPbBr₃ perovskite films with temperature changes, which verifies the feasibility of the combined device. At the same time, the integrated versatile in-situ sample cells of the combined device also expand its ability in multidimensional characterization, and will be applied to a wider range of disciplines.