摘要
The experimental methods on epitaxial lift-off of 500-run-thick low-temperature molecular beam epitaxy (MBE) grown GaAs (LT-GaAs) epilayers from the substrate on which they were grown, by means of etching out 100-nm-thick AlAs release layer, as well as their Van der Waals bonding on new substrates were studied. Melted black wax was used to the surface of the LT-GaAs in order to protect epilayers during the lift-off, which was also helpful for the outdiffusion of dissolved gas from the etching zone. Proper lift-off dimensions of LT-GaAs for a thickness of 500 nm are given. Experimental techniques are discussed to improve the quality of Van der Waals bonding. Temporal characteristics of photoconductive switches using the epitaxial lift-off LT-GaAs with a structure of coplanar strip transmission line are also given with a rise time less than 1.5 ps, and a full width at half maximum ( FWHM) of less than 2 ps.
源语言 | 英语 |
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页(从-至) | 163-166 |
页数 | 4 |
期刊 | Gaojishu Tongxin/High Technology Letters |
卷 | 16 |
期 | 2 |
出版状态 | 已出版 - 2月 2006 |