Pushing the resolution of photolithography down to 15nm by surface plasmon interference

Jianjie Dong, Juan Liu*, Guoguo Kang, Jinghui Xie, Yongtian Wang

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

63 引用 (Scopus)

摘要

A deep ultraviolet plasmonic structure is designed and a surface plasmon interference lithography method using the structure is proposed to generate large-area periodic nanopatterns. By exciting the anti-symmetric coupled surface plasmon polaritons in the structure, ultrahigh resolution periodic patterns can be formed in a photoresist. The resolution of the generated patterns can be tuned by changing the refractive index and thickness of the photoresist. We demonstrate numerically that one-dimensional and two-dimensional patterns with a half-pitch resolution of 14.6 nm can be generated in a 25 nm-thick photoresist by using the structure under 193 nm illumination. Furthermore, the half-pitch resolution of the generated patterns can be down to 13 nm if high refractive index photoresists are used. Our findings open up an avenue to push the half-pitch resolution of photolithography towards 10 nm.

源语言英语
文章编号5618
期刊Scientific Reports
4
DOI
出版状态已出版 - 8 7月 2014

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