@inproceedings{012f7cd470e24bcc9bdd0a1aa0edd8e3,
title = "Lithographic exposure latitude aware source and mask optimization",
abstract = "Source and mask optimization (SMO) technology is an increasingly important resolution enhancement technology (RET) that can optimize the source and mask. Various SMO methods have made great progress in terms of computational efficiency and pattern fidelity. Besides, process window (PW) is also an important indicator to evaluate the performance of lithography imaging. PW consists of exposure latitude (EL) and depth of focus (DOF). However, currently, there are few SMO methods that can directly improve EL. In this paper, we propose an EL aware SMO (ELASMO) method by innovating a new penalty function for improving the exposure latitude. Compared to the conventional SMO, the proposed ELASMO can significantly enhance aerial image contrast and enlarge the exposure latitude from 5% to 11% under the premise of ensuring imaging fidelity. ELASMO achieves high-fidelity lithography in a larger process window.",
keywords = "Computational lithography, Exposure latitude, Process window, Source and mask optimization (SMO)",
author = "Lulu Zou and Lihui Liu and Yiyu Sun and Pengzhi Wei and Miao Yuan and Zhaoxuan Li and Yaning Li and Yanqiu Li",
note = "Publisher Copyright: {\textcopyright} 2021 SPIE; 10th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced and Extreme Micro- Nano Manufacturing Technologies 2021 ; Conference date: 14-06-2021 Through 17-06-2021",
year = "2021",
doi = "10.1117/12.2604844",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Xiong Li and Xuan-Ming Duan and Mingbo Pu and Changtao Wang and Song Hu and Xiangang Luo",
booktitle = "10th International Symposium on Advanced Optical Manufacturing and Testing Technologies",
address = "United States",
}