Hysteresis-Free Hexagonal Boron Nitride Encapsulated 2D Semiconductor Transistors, NMOS and CMOS Inverters

Shuai Liu, Kai Yuan, Xiaolong Xu, Ruoyu Yin, Der Yuh Lin, Yanping Li, Kenji Watanabe, Takashi Taniguchi, Yongqiang Meng, Lun Dai, Yu Ye*

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

27 引用 (Scopus)

摘要

Graphene and subsequently discovered layered semiconducting transition metal dichalcogenides (TMDCs) exhibit numerous exotic physical properties and broad potential device applications. These 2D semiconducting TMDCs have become particularly interesting in next-generation electronic device applications due to their atomic thickness and nonzero bandgap. However, as there is no bulk volume, the 2D nature makes the electronic transport in these crystals highly sensitive to the environmental conditions, such as humidity, adsorbates, and trapped charges in neighboring dielectrics. Due to this environmental sensitivity, 2D-based circuits and devices suffer from a large and undesirable environment-induced hysteresis, which must be eliminated for reliable operation and computation. By mechanically assembling van der Waals (vdWs) heterostructures and edge-contacted graphite electrodes, the 2D semiconducting channel is sealed completely and protected. Here, hexagonal boron nitride (hBN) encapsulated high-performance, hysteresis-free 2D semiconductor transistors, n-type metal-oxide semiconductor, and complementary metal-oxide semiconductor inverters are fabricated. The hBN encapsulation provides excellent protection of semiconducting n-MoS2 and p-WSe2 from environmental factors, resulting in hysteresis-free 2D electronics characteristics that are necessary for the realization of 2D electronics and computing.

源语言英语
文章编号1800419
期刊Advanced Electronic Materials
5
2
DOI
出版状态已出版 - 2月 2019
已对外发布

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