Effects of In/Ce to Sn-3.5Ag lead-free solder on microstructures and properties

Enjia Chen*, Xiuchen Zhao, Ying Liu, Dongmei Li, Jingwei Cheng, Hong Li

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

3 引用 (Scopus)

摘要

The Sn-3.5Ag based lead-free electronic solder doped with element In /Ce were prepared respectively using a smelting method with protection by molten salt (SMPMS). The effects of In addition and Ce addition on microstructure, melting point and wettability of Sn-3.5Ag solder were investigated comparatively. And the effects of addition on the intermetallic compound (IMC) layer formed at solder/Cu substrate interface and the shear strength of solder joint were also studied. The results showed that appropriate In or Ce addition can refine Ag3Sn grains and improve the shear strength of solder joint. Element In can significantly reduce the melting point, narrow the melting range of the solder alloy and improve wettability on Cu substrate. When the content of In was 3%, the spreading area was the largest and the wettability was the best. The addition of Ce can efficiently reduce the thickness of the IMC layer grown at the solder/Cu substrate interface and improve the shear strength of solder joint. When the content of Ce was 0.5%, the solder joint had the minimum average IMC thickness and the maximum shear strength.

源语言英语
主期刊名Materials Performance, Modeling and Simulation
出版商Trans Tech Publications Ltd.
198-204
页数7
ISBN(印刷版)9783037856093
DOI
出版状态已出版 - 2013
活动Chinese Materials Congress 2012, CMC 2012 - Taiyuan, 中国
期限: 13 7月 201218 7月 2012

出版系列

姓名Materials Science Forum
749
ISSN(印刷版)0255-5476
ISSN(电子版)1662-9752

会议

会议Chinese Materials Congress 2012, CMC 2012
国家/地区中国
Taiyuan
时期13/07/1218/07/12

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