摘要
A new method of built-in self-test of a real time digital signal processor is offered. This method is a hybrid one of board-level testing and system-level testing, could integrate system adjustment, on-line testing and off-line testing in one BIST architecture. The implementation of the BIST is offered, and the performance of the time domain processing test and frequency domain processing test are analysed.
| 源语言 | 英语 |
|---|---|
| 页 | 983-986 |
| 页数 | 4 |
| 出版状态 | 已出版 - 2001 |
| 活动 | 2001 CIE International Conference on Radar Proceedings - Beijing, 中国 期限: 15 10月 2001 → 18 10月 2001 |
会议
| 会议 | 2001 CIE International Conference on Radar Proceedings |
|---|---|
| 国家/地区 | 中国 |
| 市 | Beijing |
| 时期 | 15/10/01 → 18/10/01 |