摘要
In this paper, analysis of beam shaping and homogenization of high power diode laser stack into a line focus with dimension of 10 mm × 0.5 mm was reported. The beam shaping and homogenization was simulated by using ZemaX-ray tracing technique. The results have shown that intensity distribution after beam shaping and homogenization at the work piece is a flat top for the slow axis with homogeneity over 95% and a Gaussian distribution for the fast axis.
| 源语言 | 英语 |
|---|---|
| 页（从-至） | 102-106 |
| 页数 | 5 |
| 期刊 | Frontiers of Optoelectronics |
| 卷 | 7 |
| 期 | 1 |
| DOI | |
| 出版状态 | 已出版 - 3月 2014 |