TY - JOUR
T1 - Multi-Resolution subspace-Based optimization method for solving three-Dimensional inverse scattering problems
AU - Ye, Xiuzhu
AU - Poli, Lorenzo
AU - Oliveri, Giacomo
AU - Zhong, Yu
AU - Agarwal, Krishna
AU - Massa, Andrea
AU - Chen, Xudong
N1 - Publisher Copyright:
© 2015 Optical Society of America.
PY - 2015/11/1
Y1 - 2015/11/1
N2 - An innovative methodology is proposed to solve quantitative three-dimensional microwave imaging problems formulated within the contrast source framework. The introduced technique is based on the combination of an efficient iterative multiscaling strategy aimed at mitigating local minimum issue arising in inverse scattering problems, and a local search algorithm based on the subspace-based optimization method (SOM) devoted to effectively retrieving both the "deterministic" and the "ambiguous" parts of the unknown contrast currents. To achieve this goal, a nested iteration process is adopted in which the outer loop iteratively refines the region of interest (ROI) where the scatterers are detected, while the inner loop retrieves the dielectric properties of the scatterers within the ROIs. Selected numerical examples are also given to show the validity and robustness of the proposed algorithm in comparison with state-of-the-art techniques.
AB - An innovative methodology is proposed to solve quantitative three-dimensional microwave imaging problems formulated within the contrast source framework. The introduced technique is based on the combination of an efficient iterative multiscaling strategy aimed at mitigating local minimum issue arising in inverse scattering problems, and a local search algorithm based on the subspace-based optimization method (SOM) devoted to effectively retrieving both the "deterministic" and the "ambiguous" parts of the unknown contrast currents. To achieve this goal, a nested iteration process is adopted in which the outer loop iteratively refines the region of interest (ROI) where the scatterers are detected, while the inner loop retrieves the dielectric properties of the scatterers within the ROIs. Selected numerical examples are also given to show the validity and robustness of the proposed algorithm in comparison with state-of-the-art techniques.
UR - http://www.scopus.com/inward/record.url?scp=84959420372&partnerID=8YFLogxK
U2 - 10.1364/JOSAA.32.002218
DO - 10.1364/JOSAA.32.002218
M3 - Article
AN - SCOPUS:84959420372
SN - 1084-7529
VL - 32
SP - 2218
EP - 2226
JO - Journal of the Optical Society of America A: Optics and Image Science, and Vision
JF - Journal of the Optical Society of America A: Optics and Image Science, and Vision
IS - 11
ER -